| Datenblatt-Suchmaschine für elektronische Bauteile |
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DS26LS31ME/883 Datenblatt(PDF) 3 Page - National Semiconductor (TI) |
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DS26LS31ME/883 Datenblatt(HTML) 3 Page - National Semiconductor (TI) |
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3 / 8 page ![]() AC Test Circuit and Switching Time Waveforms 00577803 S1 and S2 of load circuit are closed except where shown. FIGURE 1. AC Test Circuit 00577804 f = 1 MHz, tr ≤ 15 ns, tf ≤ 6ns FIGURE 2. Propagation Delays 00577805 f = 1 MHz, tr ≤ 15 ns, tf ≤ 6ns FIGURE 3. Enable and Disable Times www.national.com 3 |
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