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PIN CONFIGURATIONS

A0

SCL

SDA

6

5

4

1

2

3

GND

1

2

3

6

5

4

(TOP VIEW)

(BOTTOM VIEW)

Lot Trace Code

ABSOLUTE MAXIMUM RATINGS

(1)

DAC6571

SLAS406 – DECEMBER 2003

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated

circuits be handled with appropriate precautions. Failure to observe proper handling and installation

procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision

integrated circuits may be more susceptible to damage because very small parametric changes could

cause the device not to meet its published specifications.

PACKAGE/ORDERING INFORMATION

SPECIFIED

PACKAGE

PACKAGE

ORDERING

PRODUCT

PACKAGE

TEMPERATURE

TRANSPORT MEDIA

DESIGNATOR

MARKING

NUMBER

RANGE

DAC6571IDBVT

250 Piece Small Tape and Reel

DAC6571

SOT23-6

DBV

-40

°C to +105°C

D671

DAC6571IDBVR

3000 Piece Tape and Reel

PIN DESCRIPTION (SOT23-6)

PIN

NAME

DESCRIPTION

1

Analog output voltage from DAC

Ground reference point for all

2

GND

circuitry on the part

3

Analog Voltage Supply Input

4

SDA

Serial Data Input

5

SCL

Serial Clock Input

6

A0

Device Address Select

LOT

Year (3 = 2003); M onth (1–9 = JAN–SEP; A=OCT,

TRACE

B=NOV, C=DEC); LL– Random code generated

CODE:

when assembly is requested

UNITS

-0.3V to +6V

Digital Input voltage to GND

Operating temperature range

-40

°C to + 105°C

Storage temperature range

-65

°C to + 150°C

+ 150

°C

Power dissipation

240

°C/W

Lead temperature, soldering

Vapor phase (60s)

215

°C

Infrared (15s)

220

°C

(1)

Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. Exposure to absolute

maximum conditions for extended periods may affect device reliability.

2