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P0102BL Datenblatt(PDF) 3 Page - STMicroelectronics |
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P0102BL Datenblatt(HTML) 3 Page - STMicroelectronics |
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3 / 5 page ![]() P0102BL 3/5 Fig. 1: Maximum average power dissipation versus average on-state current. Fig. 2: Average and D.C. on-state current versus ambient temperature. Fig. 3: Relative variation of thermal impedance junction to ambient versus pulse duration. Fig. 4: Relative variation of gate trigger current, holding current and latching current versus junction temperature (typical values). Fig. 5: Relative variation of holding current versus gate-cathode resistance (typical values). Fig. 6: Relative variation of dV/dt immunity versus gate-cathode resistance (typical values). 0.00 0.02 0.04 0.06 0.08 0.10 0.12 0.14 0.16 0.18 0.00 0.02 0.04 0.06 0.08 0.10 0.12 0.14 0.16 0.18 0.20 0.22 0.24 0.26 0.28 0.30 P(W) 360 ° α α = 180 ° IT(av)(A) 0 25 50 75 100 125 0.00 0.05 0.10 0.15 0.20 0.25 0.30 IT(av)(A) α = 180° D.C Tamb(°C) 1E-2 1E-1 1E+0 1E+1 1E+2 0.01 0.10 1.00 K=[Zth(j-a)/Rth(j-a)] tp(s) -40 -20 0 20 40 60 80 100 120 140 0 1 2 3 4 5 6 IGT, IH, IL[Tj] / IGT , IH, IL[Tj = 25 °C] IH & IL (Rgk = 1k Ω) IGT Tj(°C) IH[Rgk] / IH[Rgk = 1k ] Ω Rgk(k Ω) 20 18 16 14 12 10 8 6 4 2 0 1E-2 1E-1 1E+0 1E+1 dV/dt[Rgk] / dV/dt[Rgk = 1k ] Ω Rgk(k Ω) 10.0 1.0 0.1 0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 |
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