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DS1208 Datenblatt(PDF) 5 Page - List of Unclassifed Manufacturers |
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DS1208 Datenblatt(HTML) 5 Page - List of Unclassifed Manufacturers |
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5 / 5 page ![]() DESCRIPTION VEHICLE READPOINT REV DATE CODE CONDITION QUANTITY FAILS FILE # dallas semiconductor reliability report: Process: Single Poly, Single Metal (Ti/TiN layers 0.6 µm Standard Process Metal: Al / 0.5% Cu / 0.8% Si Passivation: Summary Data with Chi-Square Distribution Assumed. Stress Ambient Temperature and Voltage to Field Ambient Temperature And Voltage Cf: 60% Ea: 0.7 β: 1 Gate Ox Thickness: 160 Å DS1208 DEVICE HRS Tuse: 55 Vuse: 5.5 °C Volts TEOS Oxide / Nitride FAILURE MECHANISM FAILURE MODE CORRECTIVE ACTION File # SUSPECT GATE OXIDE PREFUNCTIONAL IN PROCESS 22411 SUSPECT GATE OXIDE PREFUNCTIONAL IN PROCESS 22990 DEVICE REV DIE SIZE (x) No. of Transistors DIE SIZE (y) 99 C1 16100 DS12885 122 54 C1 2371 DS2401 28 54 C2 2371 DS2401 28 53 B1 0 DS2405 34 76 A1 3600 DS2409 75 56 A1 4830 DS2415 45 Wednesday, January 26, 2000 |
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