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NL17SGU04 Datenblatt(PDF) 5 Page - ON Semiconductor |
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NL17SGU04 Datenblatt(HTML) 5 Page - ON Semiconductor |
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5 / 9 page ![]() NL17SGU04 www.onsemi.com 5 Figure 5. Switching Waveforms Figure 6. Test Circuit GND 50% 50% VCC A or B Y tPHL tPLH 50% VCC INPUT CL* *Includes all probe and jig capacitances A 1−MHz square input wave is recommended for propagation delay tests. OUTPUT ORDERING INFORMATION Device Package Shipping† NL17SGU04P5T5G SOT−953 (Pb−Free) 8000 / Tape & Reel NL17SGU04DFT2G SC−88A (Pb−Free) 3000 / Tape & Reel NLV17SGU04DFT2G* SC−88A (Pb−Free) 3000 / Tape & Reel NL17SGU04AMUTCG (In Development) UDFN6 1.45x1 mm (Pb−Free) 3000 / Tape & Reel NL17SGU04CMUTCG (In Development) UDFN6 1x1 mm (Pb−Free) 3000 / Tape & Reel NLV17SGU04AMUTCG* (In Development) UDFN6 1.45x1 mm (Pb−Free) 3000 / Tape & Reel NLV17SGU04CMUTCG* (In Development) UDFN6 1x1 mm (Pb−Free) 3000 / Tape & Reel †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. *NLV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q100 Qualified and PPAP Capable. |
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