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NL17SGU04 Datenblatt(PDF) 2 Page - ON Semiconductor

Teilenummer NL17SGU04
Bauteilbeschribung  Unbuffered Inverter
PDF  9 Pages
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Hersteller  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
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NL17SGU04 Datenblatt(HTML) 2 Page - ON Semiconductor

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MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
DC Supply Voltage
−0.5 to +4.6
V
VIN
DC Input Voltage
−0.5 to +4.6
V
VOUT
DC Output Voltage
Output at High or Low State
Power−Down Mode (VCC = 0 V)
−0.5 to VCC +0.5
−0.5 to +4.6
V
IIK
DC Input Diode Current
VIN < GND
−20
mA
IOK
DC Output Diode Current
VOUT < GND
−20
mA
IOUT
DC Output Source/Sink Current
±20
mA
ICC
DC Supply Current per Supply Pin
±20
mA
IGND
DC Ground Current per Ground Pin
±20
mA
TSTG
Storage Temperature Range
−65 to +150
°C
TL
Lead Temperature, 1 mm from Case for 10 Seconds
260
°C
TJ
Junction Temperature Under Bias
+150
°C
MSL
Moisture Sensitivity
Level 1
FR
Flammability Rating
Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
VESD
ESD Withstand Voltage
Human Body Model (Note 2)
Machine Model (Note 3)
>2000
>150
V
ILATCHUP
Latchup Performance
Above VCC and Below GND at 125°C (Note 4)
±100
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Characteristics
Min
Max
Unit
VCC
Positive DC Supply Voltage
0.9
3.6
V
VIN
Digital Input Voltage
0.0
3.6
V
VOUT
Output Voltage
Output at High or Low State
Power−Down Mode (VCC = 0 V)
0.0
0.0
VCC
3.6
V
TA
Operating Temperature Range
−55
+125
°C
Dt / DV
Input Transition Rise or Fail Rate
VCC = 3.3 V ± 0.3 V
0
10
ns/V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.



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