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TM124MBK36B-70 Datenblatt(PDF) 8 Page - Texas Instruments |
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TM124MBK36B-70 Datenblatt(HTML) 8 Page - Texas Instruments |
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8 / 11 page ![]() TM124MBK36B, TM124MBK36R 1048576 BY 36-BIT TM248NBK36B, TM248NBK36R 2097152 BY 36-BIT DYNAMIC RAM MODULE SMMS137E – JANUARY 1991 – REVISEDJUNE 1995 8 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251–1443 electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS ’248NBK36B-60 ’248NBK36B-70 ’248NBK36B-80 UNIT PARAMETER TEST CONDITIONS MIN MAX MIN MAX MIN MAX UNIT VOH High-level output voltage IOH = – 5 mA 2.4 2.4 2.4 V VOL Low-level output voltage IOL = 4.2 mA 0.4 0.4 0.4 V II Input current (leakage) VCC = 5.5 V, VI = 0 V to 6.5 V, All other pins = 0 V to VCC ± 20 ± 20 ± 20 µA IO Output current (leakage) VCC = 5.5 V, VO = 0 V to VCC, CAS high ± 20 ± 20 ± 20 µA ICC1 Read or write cycle current (see Note 3) VCC = 5.5 V, Minimum cycle 963 828 738 mA ICC2 Standby current After 1 memory cycle, RAS and CAS high, VIH = 2.4 V (TTL) 36 36 36 mA ICC2 Standby current After 1 memory cycle, RAS and CAS high, VIH = VCC – 0.2 V (CMOS) 18 18 18 mA ICC3 Average refresh current (RAS only or CBR) (see Note 3) VCC = 5.5 V, Minimum cycle, RAS cycling, CAS high (RAS only), RAS low after CAS low (CBR) 1890 1620 1440 mA ICC4 Average page current (see Note 4) VCC = 5.5 V, tPC = minimum, RAS low, CAS cycling 828 738 648 mA NOTES: 3. Measured with a maximum of one address change while RAS = VIL 4. Measured with a maximum of one address change while CAS = VIH capacitance over recommended ranges of supply voltage and operating free-air temperature, f = 1 MHz (see Note 5) PARAMETER ’124MBK36B ’248NBK36B UNIT PARAMETER MIN MAX MIN MAX UNIT Ci(A) Input capacitance, A0 – A9 45 90 pF Ci(R) Input capacitance, RAS 35 35 pF Ci(C) Input capacitance, CAS 21 42 pF Ci(W) Input capacitance, W 63 126 pF Co(DQ) Output capacitance on DQ pins 7 14 pF NOTE 5: VCC = 5 V ± 0.5 V and the bias on pins under test is 0 V. |
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