Electrical modules

Very low-noise electrical samplers (280 μV at 20 GHz, 450 μV at

60 GHz, typical)

bandwidth and noise for optimal data acquisition performance

Remote samplers or compact sampling extender module cables

minimize signal degradation by allowing the sampler to be located

in close proximity to the device under test

High-performance integrated TDR (10 ps typical step rise time)

supports exceptional impedance discontinuity characterization and

high dynamic range for S-parameter measurements to 50 GHz

Analysis

Jitter, noise, and BER analysis of high-speed PAM4 and PAM2

NRZ serial data rates from <1 GBd to 60 GBd provides insight into

precise causes of eye closure

Analysis of PAM4 signals with comprehensive jitter, noise and BER

analysis for each individual PAM eye, and a set of global

measurements that assess the overall PAM4 signal attributes

100G-SR4/Transmitter and Dispersion Eye Closure (TDEC)

automation provides turn-key testing and debug of TX Optical

properties key to the SR4 Short Reach Ethernet

80STDEC streamlines high performance Transmitter and

Dispersion Eye Closure (TDEC) measurement making it ideal for

manufacturing and conformance validation applications

Automated mask testing with over 80 industry-standard masks.

New masks can be imported into the DSA8300 to support new

emerging standards. Users can define their own masks for

automated mask testing

Jitter, noise, BER, mask testing, and Serial Data Link Analysis

(SDLA) are provided through the 80SJNB Essentials and

Advanced Software Application Options

Advanced TDR analysis, S-parameter measurements, simulation

model extraction, and serial link simulation capabilities are

provided by the IConnect

400G-M4 Optical Manufacturing Analysis Software provides

Optical Transmitter and Dispersion Eye Closure Quaternary

(TDECQ) analysis

High test throughput

High sample acquisition rate up to 200 kS/s per channel

Efficient programmatic interface (IEEE-488, Ethernet, or local

processor access) enables high test throughput

Applications

Design/Verification of telecom and datacom components and systems

Manufacturing/testing for ITU/ANSI/IEEE/SONET/SDH compliance

High-performance true-differential TDR measurements

Impedance characterization and network analysis for serial data

applications including S-parameters

Advanced jitter, noise, BER and SDLA analysis

Channel and eye diagram simulation and measurement-based

modeling with IConnect.

Superior performance with extraordinary

versatility

The DSA8300 Digital Serial Analyzer is the most versatile tool for

developing and testing communications, computers, and consumer

electronics which use multi-gigabit data transmission. It is used for optical

and electrical transmitter characterization, as well as compliance

verification for devices, modules, and systems used in these products.

In addition, the DSA8300 is well-suited for electrical signal path

characterization, whether for packages, PCBs, or electrical cables. With

exceptional bandwidth, signal fidelity, and the most extensible modular

architecture, the DSA8300 provides the highest-performance TDR and

interconnect analysis, most accurate analysis of signal impairments, and

BER calculations for current and emerging serial data technology.

Optical eye diagram testing

4

Refer to the 80E00 Electrical Sampling Modules datasheet for detailed descriptions of each available module.

Datasheet

2 www.tek.com