| Datenblatt-Suchmaschine für elektronische Bauteile |
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AM29LV320ML112REF Datenblatt(PDF) 42 Page - SPANSION |
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AM29LV320ML112REF Datenblatt(HTML) 42 Page - SPANSION |
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42 / 59 page ![]() 40 Am29LV320MH/L December 14, 2005 DA TA SH EET AC CHARACTERISTICS Read-Only Operations Notes: 1. Not 100% tested. 2. See Figure 12 and Table 13 for test specifications. 3. AC specifications listed are tested with VIO = VCC. Contact AMD for information on AC operation VIO ≠ VCC. Parameter Description Test Setup Speed Options JEDE C Std. 90R 101, 101R 112R 112 120R 120 Unit t AVAV t RC Read Cycle Time (Note 1) Min 90 100 110 120 ns t AVQV t ACC Address to Output Delay CE#, OE# = V IL Max 90 100 110 120 ns t ELQV t CE Chip Enable to Output Delay OE# = V IL Max 90 100 110 120 ns t PACC Page Access Time Max 25 30 30 40 30 40 ns t GLQV t OE Output Enable to Output Delay Max 25 30 30 40 30 40 ns t EHQZ t DF Chip Enable to Output High Z (Note 1) Max 16 ns t GHQZ t DF Output Enable to Output High Z (Note 1) Max 16 ns t AXQX t OH Output Hold Time From Addresses, CE# or OE#, Whichever Occurs First Min 0 ns t OEH Output Enable Hold Time (Note 1) Read Min 0 ns Toggle and Data# Polling Min 10 ns tOH tCE Outputs WE# Addresses CE# OE# HIGH Z Output Valid HIGH Z Addresses Stable tRC tACC tOEH tRH tOE tRH 0 V RY/BY# RESET# tDF Figure 14. Read Operation Timing |
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