Figure 7. Relative variation of gate trigger current, holding

and latching current versus junction temperature (typical

values)

0.0

0.5

1.0

1.5

2.0

2.5

-40

-20

0

20

40

60

80

100

120

Tj(°C)

IGT, IH, IL [Tj] / IGT, IH, IL [Tj = 25 °C]

IGT

IH & IL

Figure 8. Relative variation of critical rate of decrease of

main current versus (dV/dt) (typical values)

0.4

0.6

0.8

1.0

1.2

1.4

1.6

1.8

2.0

2.2

2.4

0.1

1.0

10.0

100.0

(dV/dt) (V/µs)

(dI/dt)c [(dV/dt)c] / specified (dI/dt)c

BTB26

BTA26

Figure 9. Relative variation of critical rate of decrease of

main current versus junction temperature

0

1

2

3

4

5

6

7

8

0

25

50

75

100

125

(dI/dt)c [Tj ] / (dI/dt)c [Tj = 125 °C]

Tj(°C)

Figure 10. Relative variation of leakage current versus

junction temperature for different values of blocking

voltage

1.E-06

1.E-05

1.E-04

1.E-03

1.E-02

1.E-01

1.E+00

-40

-20

0

20

40

60

80

100

120

IDRM

(mA)

VD = VDRM, VR = VRRM

Tj (°C)

IRRM

/

BTA26, BTB26

Characteristics (curves)

DS13701 - Rev 1

page 5/10