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Datenblatt-Suchmaschine für elektronische Bauteile |
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Datenblatt-Suchmaschine für elektronische Bauteile |
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REF2925 Datenblatt(PDF) 46 Page - Texas Instruments |
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REF2925 Datenblatt(HTML) 46 Page - Texas Instruments |
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46 / 62 page  0 1 2 3 4 5 6 0 200 400 600 800 1000 Throughput (kSPS) C03 46 ADS8881 SBAS547D – MAY 2013 – REVISED AUGUST 2015 www.ti.com Product Folder Links: ADS8881 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated Power Saving (continued) The conversion time, tconv, is independent of the SCLK frequency. When operating the device at speeds lower than the maximum rated throughput, the conversion time, tconv, does not change; the device spends more time in power-down state. Therefore, as shown in Figure 76, the device power consumption from the AVDD supply and the external reference source is directly proportional to the speed of operation. Extremely low AVDD power-down current (50 nA, typical) and extremely low external reference leakage current (250 nA, typical), make this device ideal for very low throughput applications (such as pulsed measurements). Figure 76. Power Scaling With Throughput |
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