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TMUX1102DBVR.A Datenblatt(PDF) 26 Page - Texas Instruments |
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TMUX1102DBVR.A Datenblatt(HTML) 26 Page - Texas Instruments |
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26 / 38 page ![]() 10 Device and Documentation Support 10.1 Documentation Support 10.1.1 Related Documentation For related documentation, see the following: • Texas Instruments, Sample and Hold Glitch Reduction for Precision Outputs Reference Design. • Texas Instruments, True Differential, 4 x 2 MUX, Analog Front End, Simultaneous-Sampling ADC Circuit. • Texas Instruments, Improve Stability Issues with Low CON Multiplexers. • Texas Instruments, Simplifying Design with 1.8V logic Muxes and Switches. • Texas Instruments, Eliminate Power Sequencing with Powered-off Protection Signal Switches. • Texas Instruments, System-Level Protection for High-Voltage Analog Multiplexers. 10.2 Receiving Notification of Documentation Updates To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on Notifications to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. 10.3 Support Resources TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. 10.4 Trademarks TI E2E™ is a trademark of Texas Instruments. All trademarks are the property of their respective owners. 10.5 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 10.6 Glossary TI Glossary This glossary lists and explains terms, acronyms, and definitions. 11 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision C (November 2019) to Revision D (February 2024) Page • Updated the numbering format for tables, figures, and cross-references throughout the document................. 1 • Updated Is or Id (Continuous Current) values....................................................................................................4 • Added Ipeak values to Recommended Operating Conditions table................................................................... 4 Changes from Revision B (August 2019) to Revision C (November 2019) Page • Added links in the applications section...............................................................................................................1 • Added setting for TMUX1101 and TMUX1102 DBV package RTM....................................................................1 TMUX1101, TMUX1102 SCDS410D – MARCH 2019 – REVISED FEBRUARY 2024 www.ti.com 26 Submit Document Feedback Copyright © 2024 Texas Instruments Incorporated Product Folder Links: TMUX1101 TMUX1102 |
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