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Electrical Specifications

Dual-Core Intel® Xeon® Processor 5000 Series Datasheet

maximum allowable overshoot above VID). These specifications apply to the processor

die voltage as measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands and

across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands.

Notes:

VOS is the measured overshoot voltage above VID.

TOS is the measured time duration above VID.

2.12.2

Die Voltage Validation

Core voltage (VCC) overshoot events at the processor must meet the specifications in

Table 2-17 when measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands

and across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands. Overshoot events that

are < 10 ns in duration may be ignored. These measurement of processor die level

overshoot should be taken with a 100 MHz bandwidth limited oscilloscope.

Table 2-17. VCC Overshoot Specifications

Symbol

Parameter

Min

Max

Units

Figure

Notes

VOS_MAX

Magnitude of VCC overshoot above VID

2-5

TOS_MAX

Time duration of VCC overshoot above VID

µs

2-5

Figure 2-5. VCC Overshoot Example Waveform

Example Overshoot Waveform

Time [us]

VID - 0.000

VID + 0.050

VOS

TOS

TOS: Overshoot time above VID

VOS: Overshoot above VID

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