| Datenblatt-Suchmaschine für elektronische Bauteile |
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H30R100 Datenblatt(PDF) 6 Page - Infineon Technologies AG |
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H30R100 Datenblatt(HTML) 6 Page - Infineon Technologies AG |
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6 / 12 page ![]() IHW30N100R Soft Switching Series q Power Semiconductors 6 Rev. 2.2 Nov 08 0A 10A 20A 30A 40A 50A 100ns 1000ns t f t d(off) 20Ω 30Ω 40Ω 10ns 100ns 1000ns t f t d(off) IC, COLLECTOR CURRENT RG, GATE RESISTOR Figure 9. Typical switching times as a function of collector current (inductive load, TJ=175°C, VCE = 600V, VGE = 0/15V, RG=26Ω, Dynamic test circuit in Figure E) Figure 10. Typical switching times as a function of gate resistor (inductive load, TJ = 175°C, VCE= 600V, VGE = 0/15V, IC = 30A, Dynamic test circuit in Figure E) 25°C 50°C 75°C 100°C 125°C 150°C 100ns 1000ns t f t d(off) -50°C 0°C 50°C 100°C 2V 3V 4V 5V 6V max. typ. min. TJ, JUNCTION TEMPERATURE TJ, JUNCTION TEMPERATURE Figure 11. Typical switching times as a function of junction temperature (inductive load, VCE = 600V, VGE = 0/15V, IC = 30A, RG=26Ω, Dynamic test circuit in Figure E) Figure 12. Gate-emitter threshold voltage as a function of junction temperature (IC = 0.7mA) |
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