| Datenblatt-Suchmaschine für elektronische Bauteile |
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CXK582000TM Datenblatt(PDF) 4 Page - Sony Corporation |
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CXK582000TM Datenblatt(HTML) 4 Page - Sony Corporation |
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4 / 11 page ![]() – 4 – CXK582000TM/YM/M Input capacitance I/O capacitance Item Symbol Test conditons Min. Typ. Max. Unit CIN CI/O — — — — 7 8 pF pF VIN = 0V VI/O = 0V Input pulse high level Input pulse low level Input rise time Input fall time Input and output reference level Output load conditions VIH = 2.2V VIL = 0.8V tr = 5ns tf = 5ns 1.5V CL ∗ = 100pF, 1TTL Item Conditions AC Characteristics • AC test conditions (VCC = 5V ± 10%, Ta = 0 to +70°C) ∗ CL includes scope and jig capacitances. I/O capacitance (Ta = 25°C, f = 1MHz) Note) This parameter is sampled and is not 100% tested. TTL CL |
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