HEF4014B

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Product data sheet

Rev. 8 — 21 November 2011

8 of 14

NXP Semiconductors

HEF4014B

8-bit static shift register

Table 9.

Measurement points

Supply voltage

Input

Output

5 V to 15 V

Test data is given in Table 10;

Definitions for test circuit:

DUT = Device Under Test.

Fig 6.

Test circuit

001aag182

DUT

CL

RT

G

Table 10.

Test data

Supply voltage

Input

Load

5 V to 15 V

 20 ns

50 pF