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ADHV4702-1BCPZ-R7 Datenblatt(PDF) 15 Page - Analog Devices |
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ADHV4702-1BCPZ-R7 Datenblatt(HTML) 15 Page - Analog Devices |
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15 / 21 page ![]() Data Sheet ADHV4702-1 Rev. A | Page 15 of 21 THEORY OF OPERATION The ADHV4702-1 is a high voltage (220 V) precision amplifier designed using the next generation of proprietary bipolar/ complementary metal-oxide semiconductor (CMOS)/laterally diffused metal-oxide semiconductor (BCDMOS) process from Analog Devices. Figure 3 shows the functional block diagram. The input stage architecture offers the advantages of high input impedance with low input bias current, low input offset voltage, low drift, and low noise for precision demanding applications, such as automated test equipment (ATE). INTERNAL ELECTROSTATIC DISCHARGE (ESD) PROTECTION As shown in Figure 43, the ADHV4702-1 has an internal ESD configuration to prevent damage due to overvoltage. The ESD protection circuitry involves current steering diodes connected from the input and output pins to the power supply rails. The ADHV4702-1 also includes internal input clamping diodes across the inverting and noninverting inputs to prevent large differential input voltages from damaging the input stage transistors. This input clamping circuit greatly reduces the input impedance for differential input voltages greater than the forward-biased voltage (VF) of four diodes. The ESD protection circuitry remains inactive under normal operation. To avoid forward biasing the ESD diodes, do not overdrive the pin voltages above the absolute maximum ratings, and ensure that the input differential voltage does not exceed 4 VF. Additional external input clamping diodes may be required to protect the slew boost circuit. See the Slew Boost Circuit and Protection section. 225V ESD DGND ~5V DGND ~5V 125Ω DGND ~5V DGND ~5V ~5V DGND VEE VCC 125Ω DGND COMP IN– RESERVED IN+ RESERVED OUT TMP VEE SD VCC RADJ 1 2 3 9 8 7 6 5 4 10 11 12 Figure 43. Simplified ESD Configuration SLEW BOOST CIRCUIT AND PROTECTION The ADHV4702-1 uses a supplementary slew boosting circuit to achieve its typical slew rate of 74 V/µs across a 200 V p-p output range at unity gain. This slew boosting circuit works by sensing the differential input voltage of the amplifier and converting this voltage into a dynamic current to help drive capacitances within the signal path of the amplifier. With greater input voltage across the inputs, more dynamic current is produced, which enables the amplifier to slew faster. The current produced by the slew boosting circuit transmits to all stages of the amplifier during slewing. Internally, the ADHV4702-1 contains differential input voltage clamps that limit transient differential signals to 4 VF, placing an upper limit on the slew boost. Large differential input voltages (which can be occur with signal frequencies approaching the full power bandwidth) trigger the slew boosting circuit, resulting in an increased dynamic supply current. The relationship between slew rate and full power bandwidth (fM) is given in the following equation: SR = VO × 2πfM where VO is the peak output voltage. When operating continuously at or near full power bandwidth, the increased supply current may cause an increase in TJ beyond the safe operating temperature, resulting in device damage. The dynamic safe operating area (SOA) for the EVAL- ADHV4702-1CPZ evaluation board is shown in Figure 59 in the Safe Operating Area section. The dynamic SOA shows the connection between the output swing and the maximum input/output frequency for pulse response. To expand the SOA curve, use additional thermal management or limit the differential voltage across the inputs to 2 VF with external diodes, which limits the current produced by the slew boosting circuit and reduces the internal power dissipation. Clamping the differential input voltage of the ADHV4702-1 in this way protects the amplifier in dynamic operation but limits slew rate and large signal bandwidth. Figure 44 shows a simplified schematic with external input clamping diodes, and Figure 45 to Figure 48 show the large signal pulse response at various temperatures and gains while the ADHV4702-1 inputs are clamped by two ON Semiconductor SBAV199LT1G diode pairs at 2 VF. ADHV4702-1 5kΩ VIN 100kΩ 10kΩ VOUT EXTERNAL INPUT CLAMPING DIODES Figure 44. External Input Clamping Diodes Schematic |
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