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Datenblatt-Suchmaschine für elektronische Bauteile |
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Datenblatt-Suchmaschine für elektronische Bauteile |
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L99LD02 Datenblatt(PDF) 49 Page - STMicroelectronics |
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L99LD02 Datenblatt(HTML) 49 Page - STMicroelectronics |
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49 / 66 page  DS12448 Rev 3 49/66 L99LD02 Serial peripheral interface (ST SPI standard) 64 Executing a blank-check reading after all writing operations have been completed allows verifying that unwritten cells haven't been degraded by burning processes. Recommended test flow Testing procedure starts with a blank check read. After this operation, it is possible to select the bits to be written and to start programming. Writing operation should be performed up to 3 times. At the end of programming, a reading procedure should be performed in Margin Mode. At the end of the test, it is strongly recommended executing a blank-check read in order to verify that unwritten cells haven't been degraded. Table 29 summarizes the writing test conditions. Note: An external capacitance must be applied between VS and GROUND pins. Table 29. Writing test conditions Symbol Parameter Conditions Min Typ Max Unit VS 15 V supply 15 V IHV HV current during programming 28 mA — Temperature -40 27 150 °C — Environment Dark — External capacitance 2 5 10 nF |
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