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ADL5567ACPZN-R7 Datenblatt(PDF) 20 Page - Analog Devices |
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ADL5567ACPZN-R7 Datenblatt(HTML) 20 Page - Analog Devices |
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20 / 23 page ![]() ADL5567 Data Sheet Rev. A | Page 20 of 23 SOLDERING INFORMATION AND RECOMMENDED LAND PATTERN Figure 53 shows the recommended land pattern for the ADL5567. The ADL5567 is contained in a 4 mm × 4 mm LFCSP package, which has an exposed ground pad (EP). This pad is internally connected to the ground of the chip. To minimize thermal impedance and ensure electrical performance, solder the pad to the low impedance ground plane on the PCB. To further reduce thermal impedance, it is recommended that the ground planes on all layers under the paddle be stitched together with vias. For more information on land pattern design and layout, refer to the AN-772 Application Note, A Design and Manufacturing Guide for the Lead Frame Chip Scale Package (LFCSP). The land pattern on the ADL5567 evaluation board provides a simulated thermal resistance (θJA) of 56 °C/W. 13 MILS 39 MILS 12 MILS 91 MILS 13.7 MILS 19.7 MILS Figure 53. Recommended Land Pattern EVALUATION BOARD Figure 54 shows the schematic of the ADL5567 evaluation board. The evaluation board is powered by a single supply in the 3 V to 5 V range. The power supply is decoupled by 10 µF and 0.1 µF capacitors. Inductors L1 and L2 decouple the ADL5567 from the power supply. Table 7 details the various configuration options of the evaluation board. Figure 55 and Figure 56 show the component and circuit side layouts of the evaluation board. The balanced input and output interfaces are converted to single- ended with a pair of baluns (Mini-Circuits TCM1-43X+). The baluns at the input, T1 and T2, provide a 50 Ω single-ended to differential transformation. The output baluns, T3 and T4, and the matching components are configured to provide a 200 Ω to 50 Ω impedance transformation with an insertion loss of about 11 dB. |
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