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SX28AC/SS Datenblatt(PDF) 49 Page - Parallax Inc

Teilenummer SX28AC/SS
Bauteilbeschribung  Configurable Communications Controllers with EE/Flash Program Memory, In-System Programming Capability and On-Chip Debug
PDF  51 Pages
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Hersteller  PARALLAX [Parallax Inc]
Direct Link  https://www.parallax.com/
Logo PARALLAX - Parallax Inc

SX28AC/SS Datenblatt(HTML) 49 Page - Parallax Inc

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Parallax SX20AC/SX28AC
www.parallax.com
© Parallax Inc.
Page 49 of 51
Rev 1.6 11/20/2006
19.0 MANUFACTURING INFORMATION
19.1.
Reflow Peak Temperature
Package Type
Reflow Peak Temp.
Leaded
235+5/-0 °C
Green/RoHS
255+5/-0 °C
19.2.
MSL3 Compliance
Chips shipped in production quantities are MSL3
compliant.
For chips shipped in sample quantities or
stored in compromised packaging,
you may want to
remove excess moisture before assembly by baking at
93 °C for 12 hours immediately before commencing
soldering production.
19.3.
Green/RoHS Compliance
All SX part numbers ending in “-G” are certified
Green/RoHS Compliant. The Certificates of Compliance
are appended to this datasheet; full test reports for each
model can be obtained by contacting the Parallax Sales
Team.
19.4.
Stress Testing Data Summary
The Parallax SX chip is packaged by a different supplier
than previously used for the Ubicom SX. For this reason
Parallax engaged in a series of stress tests useful for a
change of packaging suppliers. Parallax SX chips
packaged at Greatek in Taiwan were exposed to these
stresses between June and September 2006. The stresses
were provided by a separate stress testing reliability
qualification services firm (Nano Measurements in Santa
Clara, California).
The stress tests chosen are common for a change of
packaging suppliers. The stress testing firm conducted the
tests in accordance with the applicable Joint Electron
Device
Engineering
Council
(www.jedec.com)
guidelines.
The following stresses were chosen:
• Preconditioning, Level 3, 192 hours 30° C, 60% RH,
preflow peak leaded and unleaded (depending on the
package)
• JESD22-A118, unbiased HAST 192 hours,
110°-130° C, 85% RH, 10-20 PSIG
• JESD22-A102, autoclave, 121° C, 100% RH, 15
PSIG, non-biased, 96 hours
RoHS-compliant and standard chips were exposed to the
stresses separately to further identify if failures would be
associated with a particular package type. Between each
stress, the parts were sent back to Parallax for our
standard production test which exercises the I/O, RAM
and EE/Flash memory, operating voltage and current
draw.
The results are that 100% of the chips passed the Parallax
standard production test, in between and after the stresses
were applied to the chips.
Stock Code
Tested
Passed
SX20AC/SS-G
20
20
SX28AC/SS-G
20
20
SX28AC/DP-G
17
17
SX48BD-G
20
20
Subtotal
77
77
SX20AC/SS-G
20
20
SX28AC/SS-G
20
20
SX28AC/DP-G
17
17
SX48BD-G
20
20
Subtotal
77
77
Other stress test data are available upon request from the
Parallax
Research
and
Development
team,
contact
Parallax Sales or Tech Support.
Parallax Sales and Tech Support Contact Information
For the latest information on SX programming tools, development boards, compilers, instructional materials, and application
examples, please visit www.parallax.com/sx.
Parallax, Inc.
599 Menlo Drive, Suite 100
Rocklin, CA 95765
Sales/Tech Support: (916) 624-8333
Toll Free in the US: 1-888-512-1024
Sales: sales@parallax.com
Tech Support: support@parallax.com



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