TLC5540

SLAS105D − JANUARY 1995 − REVISED APRIL 2004

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3

Terminal Functions

TERMINAL

I/O

DESCRIPTION

NAME

NO.

I/O

DESCRIPTION

AGND

20, 21

Analog ground

ANALOG IN

19

I

Analog input

CLK

12

I

Clock input

DGND

2, 24

Digital ground

D1 −D8

3−10

O

Digital data out. D1:LSB, D8:MSB

OE

1

I

Output enable. When OE = L, data is enabled. When OE = H, D1−D8 is high impedance.

VDDA

14, 15, 18

Analog VDD

VDDD

11, 13

Digital VDD

REFB

23

I

ADC reference voltage in (bottom)

REFBS

22

Reference voltage (bottom). When using the internal voltage divider to generate a nominal 2-V reference, the

REFBS terminal is shorted to the REFB terminal and the REFTS terminal is shorted to the REFT terminal (see

Figure 13 and Figure 14).

REFT

17

I

Reference voltage in (top)

REFTS

16

Reference voltage (top). When using the internal voltage divider to generate a nominal 2-V reference, the

REFTS terminal is shorted to the REFT terminal and the REFBS terminal is shorted to the REFB terminal (see

Figure 13 and Figure 14).

7 V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . . . . . . . . . . .

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

0

°C to 70°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

TLC5540I

−40

°C to 85°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

−55

°C to 150°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and

functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied.

Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.