TLE8262E datasheet(16/93 Pages) INFINEON

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Data Sheet

Rev. 1.0, 2009-03-31

TLE8262E

General Product Characteristics

5.1

Absolute Maximum Ratings

Absolute Maximum Ratings 1)

Tj = -40 °C to +150 °C; all voltages with respect to ground, positive current flowing into pin

(unless otherwise specified)

1) Not subject to production test; specified by design

Pos.

Parameter

Symbol

Limit Values

Unit Test Conditions

Min.

Max.

Voltages

5.1.1

Supply Voltage

-0.3

–

5.1.2

Supply Voltage Slew Rate

S/dt

-0.5

V/µs –

5.1.3

Regulator Output Voltage

cc1µC/2/3

-0.3

5.5

–

5.1.4

CAN Bus Voltage (CANH, CANL)

CANH/L

-27

–

5.1.5

Differential Voltage CANH, CANL, SPLIT

diffESD

-40

CANH-CANL<|40 V|;

CANH-SPLIT<|40 V|

CANL-SPLIT<|40 V|;

5.1.6

Input Voltage at VCCHSCAN

CCHSCAN

-0.3

5.5

–

5.1.7

Voltage at SPLIT, WK

SPLIT

-27

–

5.1.8

Voltage at Test

Test,max

-0.3

–

5.1.9

Voltage at Vcc3base, Vcc3shunt, Vcc3REF

cc3base

-0.3

–

5.1.10 Voltage at Limp Home (LH, pin)

-0.3

–

5.1.11 Logic Voltages Input Pin (SDI, CLK,

CSN, TxDLINx, TxDCAN)

-0.3

CC1µC +

0.3V

V0 V <

S < 28 V

0 V <

CC1µC < 5.5 V

5.1.12 Logic Voltage Output PIN (SDO, RO,

INT, RxDLINx, RxDCAN)

DRI,RD

-0.3

CC1µC +

0.3V

V0 V <

S < 28 V

0 V <

CC1µC < 5.5 V

5.1.13 LIN Line Bus Input Voltages

bus

-27

–

Currents

5.1.14 Reverse current on pin Vs

IVS

-500

–

S < VCC

Temperatures

5.1.15 Junction Temperature

-40

150

°C–

5.1.16 Storage Temperature

stg

-55

150

°C–

ESD Susceptibility

5.1.17 Electrostatic Discharge Voltage at BusX,

CANH, CANL, SPLIT versus GND

ESD

-6

2) HBM (100 pF via

1.5 k

Ω)

2) ESD susceptibility Human Body Model “HBM” according to JESD22-A114

5.1.18 Electrostatic Discharge Voltage

ESD

-2

2) HBM (100 pF via

1.5 k

Ω)

5.1.19 Electrostatic Discharge CDM

Corner Pins (Pin 1, 18, 19, 36)

VESD_CDM

-750

750

3) ESD susceptibility Charged Device Model “CDM” according to ESDA STM5.3.1

Electrostatic Discharge CDM

VESD_CDM -500

500

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