18

Advance Information

4 Mbit LPC Flash

SST49LF040

©2001 Silicon Storage Technology, Inc.

S71213-00-000

11/01 562

Symbol

Parameter

Minimum

Units

Power-up to Read Operation

100

µs

Power-up to Write Operation

100

µs

T10.0 562

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter

Parameter

Description

Test Condition

Maximum

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

I/O Pin Capacitance

12 pF

Input Capacitance

6 pF

T11.0 562

Symbol

Parameter

Minimum

Specification

Units

Test Method

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

Endurance

10,000

Cycles

JEDEC Standard A117

Data Retention

100

Years

JEDEC Standard A103

Latch Up

mA

JEDEC Standard 78

T12.0 562

Symbol

Parameter

Min

Max

Units

LCLK Cycle Time

30

ns

LCLK High Time

11

ns

LCLK Low Time

11

ns

-

LCLK Slew Rate (peak-to-peak)

1

4

V/ns

-

RST# or INIT# Slew Rate

50

mV/ns

T13.0 562

562 ILL F05.0

0.4 VDD p-to-p

(minimum)

Tcyc

Thigh

Tlow

0.4 VDD

0.3 VDD

0.6 VDD

0.2 VDD

0.5 VDD