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Z8018233FSC Datenblatt(PDF) 80 Page - Zilog, Inc.

Teilenummer Z8018233FSC
Bauteilbeschribung  ZILOG INTELLIGENT PERIPHERAL CONTROLLER (ZIP??
PDF  109 Pages
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Hersteller  ZILOG [Zilog, Inc.]
Direct Link  http://www.zilog.com
Logo ZILOG - Zilog, Inc.

Z8018233FSC Datenblatt(HTML) 80 Page - Zilog, Inc.

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Z80182/Z8L182
ZILOG INTELLIGENT PERIPHERAL
PRELIMINARY
Zilog
DS971820600
ABSOLUTE MAXIMUM RATINGS
Voltage on V
CC with respect to VSS ........... –0.3V to +7.0V
Voltages on all inputs
with respect to V
SS ........................... –0.3V to VCC +0.3V
Operating Ambient Temperature ................... 0 to +70
°C
Storage Temperature ............................ –55
°C to +150°C
STANDARD TEST CONDITIONS
The DC Characteristics and capacitance sections below
apply for the following standard test conditions, unless
otherwise noted. All voltages are referenced to GND (0V).
Positive current flows into the referenced pin (Figure 89).
Available operating temperature range is:
S = 0
°C to +70°C
Voltage Supply Range:
+4.50V
≤ V
CC ≤ + 5.50V Z80182
+3.0V
≤ V
CC ≤ + 3.60V Z8L182
All AC parameters assume a load capacitance of 100 pF.
Add 10 ns delay for each 50 pF increase in load up to a
maximum of 150 pF for the data bus and 100 pF for
address and control lines. AC timing measurements are
referenced to 1.5 volts (except for clock, which is referenced
to the 10% and 90% points). Maximum capacitive load for
CLK is 125 pF.
Note: The ESCCCore is only guaranteed to operate at 20
MHz 5.0 volts or 10 MHz 3.3 volts. Upon reset, the Z182
system clock is "divided by one" before clocking the
ESCC. When Z182 is operated above 20 MHz 5.0 volts or
10 MHz 3.3 volts, the ESCC should be programmed to
"divide-by-two" mode.
Stresses greater than those listed under Absolute Maximum
Ratings may cause permanent damage to the device. This
is a stress rating only; operation of the device at any
condition above those indicated in the operational sections
of these specifications is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect device reliability.
+5V
From Output
Under Test
100 pF
250
µA
2.1 k
Figure 89. Test Load Diagram



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