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AMMCL002AWP Datenblatt(PDF) 21 Page - Advanced Micro Devices

Teilenummer AMMCL002AWP
Bauteilbeschribung  2 or 4 Megabyte 3.0 Volt-only Flash Miniature Card
PDF  36 Pages
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Hersteller  AMD [Advanced Micro Devices]
Direct Link  http://www.amd.com
Logo AMD - Advanced Micro Devices

AMMCL002AWP Datenblatt(HTML) 21 Page - Advanced Micro Devices

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AmMCL00XA
21
PRELIMIN ARY
ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . . . –40
°C to +90°C
Ambient Temperature
with Power Applied . . . . . . . . . . . . . . –40
°C to +85°C
Voltage at All Pins (Note 1) . . . . –0.5 V to VCC+0.5 V
VCC (Note 1) . . . . . . . . . . . . . . . . . . . . –0.5 V to 3.6 V
Output Short Circuit Current (Note 2) . . . . . . 200 mA
Notes:
1. Minimum DC voltage on input or I/O pins is –0.5 V. During
voltage transitions, inputs may overshoot VSS to –2.0 V
for periods of up to 20 ns. Maximum DC voltage on output
and I/O pins is VCC + 0.5 V. During voltage transitions,
outputs may overshoot to VCC + 2.0 V for periods up to
20ns.
2. No more than one output shorted at a time. Duration of
the short circuit should not be greater than one second.
Conditions equal VOUT = 0.5 V or 3.6 V, VCC = VCCmax.
These values are chosen to avoid test problems caused
by tester ground degradation. This parameter is sampled
and not 100% tested, but guaranteed by characterization.
3. Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only; functional operation of the de-
vice at these or any other conditions above those indi-
cated in the operational sections of this specification is
not implied. Exposure of the device to absolute maximum
rating conditions for extended periods may affect device
reliability.
OPERATING RANGES
Commercial Devices
Case Temperature (TC). . . . . . . . . . . . . .0°C to +70°C
Industrial (I) Devices
Case Temperature (TC). . . . . . . . . . . .–40°C to +85°C
VCC Supply Voltages
AmMCL00XAWP-150 . . . . . . . . . . . . +2.7 V to +3.6 V
Operating ranges define those limits between which the
functionality of the device is guaranteed.



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