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ADS5500MPAPREP Datenblatt(PDF) 8 Page - Texas Instruments

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Teilenummer ADS5500MPAPREP
Bauteilbeschribung  Analog-To-Digital Converter
PDF  37 Pages
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Hersteller  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

ADS5500MPAPREP Datenblatt(HTML) 8 Page - Texas Instruments

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ADS5500-EP
SGLS286C − JUNE 2005 – REVISED SEPTEMBER 2008
www.ti.com
8
TIMING CHARACTERISTCS
16.5 Clock Cycles
Input Clock
Output Clock
Data Out
(D0−D13)
Analog
Input
Signal
Sample
N
N+ 1
N+ 2
N+ 3
N+ 4
N+ 15
N+ 16
N+ 17
N
- 17
N
- 16
N
- 15
N
- 13
N
- 3N - 2N - 1N
tA
tSETUP
tHOLD
Data Invalid
tPDI
NOTE: It is recommended that the loading at CLKOUT and all data lines are accurately matched to ensure that the above timing
matches closely with the specified values.
Figure 2. Timing Diagram
TIMING CHARACTERISTICS (1)
Typ, min, and max values at TA = 25°C, min and max specified over the full recommended operating temperature range,
AVDD = DRVDD = 3.3 V, 3−VPP differential clock, and CLOAD = 10 pF (unless otherwise noted)
PARAMETER
DESCRIPTION
TYP
UNIT
Switching Specification
Aperture delay, tA
Input CLK falling edge to data sampling point
1
ns
Aperture jitter (uncertainty)
Uncertainty in sampling instant
300
fs
Data setup time, tSU
Data valid(2) to 50% of CLKOUT rising edge
2.5
ns
Data hold time, th
50% of CLKOUT rising edge to data becoming invalid(2)
2.1
ns
Input clock to output data valid
start(3)(4), tSTART
Input clock rising edge to Data valid start delay
2.2
ns
Input clock to output data valid
end(3)(4), tEND
Input clock rising edge to Data valid end delay
6.9
ns
Output clock jitter, tJIT
Uncertainty in CLKOUT rising edge, peak−to−peak
150
ps
Output clock rise time, tr
Rise time of CLKOUT measured from 20% to 80% of
DRVDD
1.7
ns
Output clock fall time, tf
Fall time of CLKOUT measured from 80% to 20% of
DRVDD
1.5
ns
Input clock to output clock delay,
tPDI
Input clock rising edge, zero crossing, to output clock
rising edge 50%
4.8
ns
Data rise time, tr
Data rise time measured from 20% to 80% of DRVDD
3.6
ns
Data fall time, tf
Data fall time measured from 80% to 20% of DRVDD
2.8
ns
Latency Time for a sample to
propagate to the ADC outputs
17.5 clock cycles
17.5
Clock Cycles
(1) Timing parameters are ensured by design and characterization and not tested in production.
(2) Data valid refers to 2 V for LOGIC high and 0.8 V for LOGIC low.
(2) See the Output Information section for details on using the input clock for data capture.
(4) These specifications apply when the CLKOUT polarity is set to rising edge (according to Table 3). Add one−half clock period for the valid number
for a falling−edge CLKOUT polarity.



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