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ADS5500MPAPREP Datenblatt(PDF) 13 Page - Texas Instruments |
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ADS5500MPAPREP Datenblatt(HTML) 13 Page - Texas Instruments |
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13 / 37 page ![]() ADS5500-EP SGLS286C − JUNE 2005 – REVISED SEPTEMBER 2008 www.ti.com 13 DEFINITION OF SPECIFICATIONS Analog Bandwidth The analog input frequency at which the spectral power of the fundamental frequency (as determined by FFT analysis) is reduced by 3 dB Aperture Delay The delay in time between the falling edge of the input sampling clock and the actual time at which the sampling occurs Aperture Uncertainty (Jitter) The sample-to-sample variation in aperture delay Clock Pulse Width/Duty Cycle A perfect differential sine−wave clock results in a 50% clock duty cycle on the internal coversion clock. Pulse width high is the minimum amount of time that the ENCODE pulse should be left in logic 1 state to achieve rated performance. Pulse width low is the minimum time that the ENCODE pulse should be left in a low state (logic 0). At a given clock rate, these specifications define an acceptable clock duty cycle. Differential Nonlinearity (DNL) An ideal ADC exhibits code transitions that are exactly one LSB apart. DNL is the deviation of any single LSB transition at the digital output from an ideal one LSB step at the analog input. If a device claims to have no missing codes, it means that all possible codes (for a 14-bit converter, 16384 codes) are present over the full operating range. Effective Number of Bits (ENOB) The effective number of bits for a sine−wave input at a given input frequency can be calculated directly from its measured SINAD using the following formula: ENOB + SINAD * 1.76 6.02 If SINAD is not known, SNR can be used exceptionally to calculate ENOB (ENOBSNR). Effective Resolution Bandwidth The highest input frequency where the SNR (dB) is dropped by 3 dB for a full-scale input amplitude Gain Error The amount of deviation between the ideal transfer function and the measured transfer function (with the offset error removed) when a full-scale analog input voltage is applied to the ADC, resulting in all ones in the digital code. Gain error is usually given in LSB or as a percent of full-scale range (%FSR). Integral Nonlinearity (INL) The deviation of the transfer function from a reference line measured in fractions of one LSB using a best straight line or best fit determined by a least square curve fit. INL is independent from effects of offset, gain, or quantization errors. Maximum Conversion Rate The encode rate at which parametric testing is performed. This is the maximum sampling rate where certified operation is given. Minimum Conversion Rate The minimum sampling rate where the ADC still works. Nyquist Sampling When the sampled frequencies of the analog input signal are below fCLOCK/2, it is called Nyquist sampling. The Nyquist frequency is fCLOCK/2, which can vary depending on the sample rate (fCLOCK). Offset Error The deviation of output code from mid-code when both inputs are tied to common-mode Propagation Delay The delay between the input clock rising edge and the time when all data bits are within valid logic levels Signal-to-Noise and Distortion (SINAD) The RMS value of the sine wave fIN (input sine wave for an ADC) to the RMS value of the noise of the converter from DC to the Nyquist frequency, including harmonic content. It is typically expressed in decibels (dB). SINAD includes harmonics, but excludes DC. SINAD + 20Log (10) Input(V S ) Noise ) Harmonics Signal-to-Noise Ratio (Without Harmonics) SNR is a measure of signal strength relative to background noise. The ratio is usually measured in dB. If the incoming signal strength in µV is VS, and the noise level (also in µV) is VN, the SNR in dB is given by the formula: SNR + 20Log (10) V S V N This is the ratio of the RMS signal amplitude, VS (set one dB below full-scale), to the RMS value of the sum of all other spectral components, VN, excluding harmonics and dc. |
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