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L9660 Datenblatt(PDF) 25 Page - STMicroelectronics |
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L9660 Datenblatt(HTML) 25 Page - STMicroelectronics |
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25 / 49 page ![]() DocID024714 Rev 2 25/49 L9660 Functional description 48 A “real-time” current measurement status of all the channels is available. If a current limit status request is sent then the L9660 reports in the next SPI transfer whether the current is above or below IMEAS for each of the channels. The current status results can be read at any time and correctly reports whether current is flowing. The content of the internal current status register is captured on the falling edge of chip select during the SPI response. The internal status register is updated at a nominal sample time of 25 µs and is independent from SPI transfers. For this circuit there is a continuously performed compensation of the comparator in order to remove offset errors, which is independent from SPI commands. The compensation is being performed every 12.8 µs based on the internal clock. 3.4.3 Fire enable (FEN) function description The Fire Enable (FEN) function is the result of the FENx input OR’d with the internal FEN latch. If the FEN latch is not enabled and the FENx pin is low then activations of the FET drivers are disabled except as indicated during the MOS test. All internal diagnostics are active, and results are available through the serial interface. This pin must be pulled high to initiate the FEN latch function (if programmed) and enable firing of the FET drivers. There are two FEN function blocks FEN Function 1 is FEN1 input OR’d with FEN1 latch timer and used for enabling channels 0 & 1 FEN Function 2 is FEN1 input OR’d with FEN2 latch timer and used for enabling channels 2 & 3 The FEN function is considered active when the pin is active (‘1’ or high) for more than 12 microseconds. Tolerance range for the filter used is 12 to 16 µs. When the FENx input is active, ‘1’, the FEN function activates. When the FENx input state transitions from ‘1’ to ‘0’, the programmable latching function holds the FEN function active until the time-out of the FEN timer. The programmable latch and hold function are capable of delays of 0ms, 128ms, 256ms, and 512ms. There are 2 independent timers with the timer for FEN1 associated with channels 0 & 1, timer for FEN2 associated with channels 2 & 3. The timer is reset to the programmed time when the FENx pin transitions from ‘0’ to ‘1’. The programmable counter delay is set through a SPI command. 3.4.4 Squib diagnostics Overview The ASIC is able to perform the following diagnostics Short to battery and ground on both SQHx and SQLx pins with or without a squib Loop to loop diagnostics Squib resistance measurement Squib High resistance High side safing FET diagnostics VRESx voltage status High and low side FET diagnostics Below is a block diagram showing the components involved in the squib diagnostics. |
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