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MCF5373CAB180 Datenblatt(PDF) 15 Page - Freescale Semiconductor, Inc

Teilenummer MCF5373CAB180
Bauteilbeschribung  Microprocessor Data Sheet
PDF  42 Pages
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Hersteller  FREESCALE [Freescale Semiconductor, Inc]
Direct Link  http://www.freescale.com
Logo FREESCALE - Freescale Semiconductor, Inc

MCF5373CAB180 Datenblatt(HTML) 15 Page - Freescale Semiconductor, Inc

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Preliminary Electrical Characteristics
MCF5373 ColdFire® Microprocessor Data Sheet, Rev. 0.3
Preliminary
Freescale Semiconductor
15
5.2
Thermal Characteristics
The average chip-junction temperature (TJ) in °C can be obtained from:
Eqn. 1
Where:
TA
= Ambient Temperature, °C
QJMA
= Package Thermal Resistance, Junction-to-Ambient, °C/W
PD
=PINT + PI/O
PINT
=IDD × IVDD, Watts - Chip Internal Power
PI/O
= Power Dissipation on Input and Output Pins — User Determined
5
Power supply must maintain regulation within operating EVDD range during instantaneous
and operating maximum current conditions. If positive injection current (Vin > EVDD) is greater
than IDD, the injection current may flow out of EVDD and could result in external power supply
going out of regulation. Insure external EVDD load will shunt current greater than maximum
injection current. This will be the greatest risk when the MCU is not consuming power (ex; no
clock). Power supply must maintain regulation within operating EVDD range during
instantaneous and operating maximum current conditions.
Table 5. Thermal Characteristics
Characteristic
Symbol
256MBGA
196MBGA
160QFP
Unit
Junction to ambient, natural convection
Four layer board
(2s2p)
θ
JMA
261,2
NOTES:
1
θ
JMA and Ψjt parameters are simulated in conformance with EIA/JESD Standard 51-2 for natural convection. Freescale
recommends the use of
θ
JmA and power dissipation specifications in the system design to prevent device junction
temperatures from exceeding the rated specification. System designers should be aware that device junction
temperatures can be significantly influenced by board layout and surrounding devices. Conformance to the device
junction temperature specification can be verified by physical measurement in the customer’s system using the
Ψ
jt
parameter, the device power dissipation, and the method described in EIA/JESD Standard 51-2.
2
Per JEDEC JESD51-6 with the board horizontal.
321,2
401,2
°C/W
Junction to ambient (@200 ft/min)
Four layer board
(2s2p)
θ
JMA
231,2
291,2
361,2
°C/W
Junction to board
θ
JB
153
3
Thermal resistance between the die and the printed circuit board in conformance with JEDEC JESD51-8. Board
temperature is measured on the top surface of the board near the package.
203
253
°C/W
Junction to case
θ
JC
104
4
Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1).
104
104
°C/W
Junction to top of package
Ψ
jt
21,5
5
Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is
written in conformance with Psi-JT.
21,5
21,5
°C/W
Maximum operating junction temperature
Tj
105
105
105
oC
TJ
TA
PD ΘJMA
×
()
+
=



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