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MCP3910A1T-E/ML Datenblatt(PDF) 49 Page - Microchip Technology

Teilenummer MCP3910A1T-E/ML
Bauteilbeschribung  3V Two-Channel Analog Front End
PDF  86 Pages
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Hersteller  MICROCHIP [Microchip Technology]
Direct Link  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

MCP3910A1T-E/ML Datenblatt(HTML) 49 Page - Microchip Technology

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 2012-2014 Microchip Technology Inc.
DS20005116B-page 49
MCP3910
6.8
ADC Channels Latching and
Synchronization
The ADC channel’s data output registers (addresses
0x00 to 0x01) have a double buffer output structure.
The two sets of latches in series are triggered by the
data ready signal and an internal signal indicating the
beginning of a read communication sequence (read
start).
The first set of latches holds each ADC channel data
output register when the data is ready, and latches all
active outputs together when DR_LINK = 1. This
behavior is synchronous with the MCLK clock.
The second set of latches ensures that when reading
starts on an ADC output, the corresponding data is
latched, so that no data corruption can occur within a
read. This behavior is synchronous with the SCK clock.
If an ADC read has started, in order to read the follow-
ing ADC output, the current reading needs to be fully
completed (all bits must be read on the SDO pin from
the ADC output data registers).
Since the double output buffer structure is triggered
with two events that depend on two asynchronous
clocks (data ready with MCLK and read start with SCK),
it is recommended to implement one of the three
following methods on the MCU or the processor, in
order to synchronize the reading of the channels:
1.
Use the Data Ready pin pulses as an
interrupt
: once a falling edge occurs on the DR
pin, the data is available for reading on the ADC
output registers after the tDODR timing. If this
timing is not respected, data corruption can
occur.
2.
Use a timer clocked with MCLK as a
synchronization event:
since the data ready is
synchronous with MCLK, the user can calculate
the position of the data ready depending on the
PHASE, the OSR<2:0> and the PRE<1:0>
settings for each channel. Again, the tDODR
timing needs to be added to this calculation, to
avoid data corruption.
3.
Poll
the
DRSTATUS<1:0>
bits
in
the
STATUSCOM register:
this method consists of
continuously reading the STATUSCOM register
and waiting for the DRSTATUS bits to be equal
to '0'. When this event happens, the user can
start a new communication to read the desired
ADC data. In this case, no additional timing is
required.
The first method is the preferred one, as it can be used
without adding additional MCU code space, but
requires connecting the DR pin to an I/O pin of the
MCU. The two last methods require more MCU code
space and execution time, but they allow synchronizing
the reading of the channels without connecting the DR
pin, which saves one I/O pin on the MCU.
6.9
Securing Read Communications
Through CRC-16 Checksum
Since power/energy metering systems can generate or
receive large EMI/EMC interferences and large
transient spikes, it is helpful to secure SPI
communications as much as possible to maintain data
integrity and desired configurations during the lifetime
of the application.
The communication data on the SDO pin can be
secured through the insertion of a Cyclic Redundancy
Check (CRC) checksum at the end of each continuous
reading sequence. The CRC checksum on the
communications can be enabled or disabled through
the EN_CRCCOM bit in the STATUSCOM register. The
CRC message ensures the integrity of the read
sequence bits transmitted on the SDO pin, and the
CRC checksum is inserted in between each read
sequence (see Figure 6-9).



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