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STM32L021D4 Datenblatt(PDF) 52 Page - STMicroelectronics |
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STM32L021D4 Datenblatt(HTML) 52 Page - STMicroelectronics |
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52 / 114 page ![]() Electrical characteristics STM32L021x4 52/114 DocID027982 Rev 5 6.3.4 Supply current characteristics The current consumption is a function of several parameters and factors such as the operating voltage, temperature, I/O pin loading, device software configuration, operating frequencies, I/O pin switching rate, program location in memory and executed binary code. The current consumption is measured as described in Figure 12: Current consumption measurement scheme. All Run-mode current consumption measurements given in this section are performed with a reduced code that gives a consumption equivalent to Dhrystone 2.1 code if not specified otherwise. The current consumption values are derived from the tests performed under ambient temperature and VDD supply voltage conditions summarized in Table 17: General operating conditions unless otherwise specified. The MCU is placed under the following conditions: • All I/O pins are configured in analog input mode • All peripherals are disabled except when explicitly mentioned • The Flash memory access time and prefetch is adjusted depending on fHCLK frequency and voltage range to provide the best CPU performance unless otherwise specified. • When the peripherals are enabled fAPB1 = fAPB2 = fAPB • When PLL is ON, the PLL inputs are equal to HSI = 16 MHz (if internal clock is used) or HSE = 16 MHz (if HSE bypass mode is used) • The HSE user clock is applied to CK_IN. It follows the characteristic specified in Table 34: High-speed external user clock characteristics • For maximum current consumption VDD = VDDA = 3.6 V is applied to all supply pins • For typical current consumption VDD = VDDA = 3.0 V is applied to all supply pins if not specified otherwise 4. Guaranteed by design, not tested in production. 5. Shortest sampling time can be determined in the application by multiple iterations. 6. To guarantee less than 1% VREF_OUT deviation. |
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