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STM32L021D4 Datenblatt(PDF) 74 Page - STMicroelectronics |
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STM32L021D4 Datenblatt(HTML) 74 Page - STMicroelectronics |
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74 / 114 page ![]() Electrical characteristics STM32L021x4 74/114 DocID027982 Rev 5 6.3.12 I/O current injection characteristics As a general rule, current injection to the I/O pins, due to external voltage below VSS or above VDD (for standard pins) should be avoided during normal product operation. However, in order to give an indication of the robustness of the microcontroller in cases when abnormal injection accidentally happens, susceptibility tests are performed on a sample basis during device characterization. Functional susceptibility to I/O current injection While a simple application is executed on the device, the device is stressed by injecting current into the I/O pins programmed in floating input mode. While current is injected into the I/O pin, one at a time, the device is checked for functional failures. The failure is indicated by an out of range parameter: ADC error above a certain limit (higher than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out of –5 µA/+0 µA range), or other functional failure (for example reset occurrence oscillator frequency deviation). The test results are given in the Table 48. Table 47. Electrical sensitivities Symbol Parameter Conditions Class LU Static latch-up class TA = +125 °C conforming to JESD78A II level A Table 48. I/O current injection susceptibility Symbol Description Functional susceptibility Unit Negative injection Positive injection IINJ Injected current on BOOT0 -0 NA(1) 1. Current injection is not possible. mA Injected current on all FT pins -5 (2) 2. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially inject negative currents. NA(1) Injected current on any other pin -5 (2) +5 |
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