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STM32L021D4 Datenblatt(PDF) 73 Page - STMicroelectronics |
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STM32L021D4 Datenblatt(HTML) 73 Page - STMicroelectronics |
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73 / 114 page ![]() DocID027982 Rev 5 73/114 STM32L021x4 Electrical characteristics 93 To complete these trials, ESD stress can be applied directly on the device, over the range of specification values. When unexpected behavior is detected, the software can be hardened to prevent unrecoverable errors occurring (see application note AN1015). Electromagnetic Interference (EMI) The electromagnetic field emitted by the device are monitored while a simple application is executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with IEC 61967-2 standard which specifies the test board and the pin loading. 6.3.11 Electrical sensitivity characteristics Based on three different tests (ESD, LU) using specific measurement methods, the device is stressed in order to determine its performance in terms of electrical sensitivity. Electrostatic discharge (ESD) Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according to each pin combination. The sample size depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test conforms to the ANSI/JEDEC standard. Static latch-up Two complementary static tests are required on six parts to assess the latch-up performance: • A supply overvoltage is applied to each power supply pin • A current injection is applied to each input, output and configurable I/O pin These tests are compliant with EIA/JESD 78A IC latch-up standard. Table 45. EMI characteristics Symbol Parameter Conditions Monitored frequency band Max vs. frequency range (32 MHz voltage Range 1) Unit SEMI Peak level VDD = 3.3 V, TA = 25 °C, LQFP32 package compliant with IEC 61967-2 0.1 to 30 MHz -22 dBµV 30 to 130 MHz -7 130 MHz to 1GHz -12 SAE EMI Level 1 - Table 46. ESD absolute maximum ratings Symbol Ratings Conditions Class Maximum value(1) 1. Guaranteed by characterization results, not tested in production. Unit VESD(HBM) Electrostatic discharge voltage (human body model) TA = +25 °C, conforming to ANSI/JEDEC JS-001 22000 V VESD(CDM) Electrostatic discharge voltage (charge device model) TA = +25 °C, conforming to ANSI/ESD STM5.3.1. C4 500 |
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