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STM32L021D4 Datenblatt(PDF) 73 Page - STMicroelectronics

Teilenummer STM32L021D4
Bauteilbeschribung  Access line ultra-low-power 32-bit MCU Arm®-based Cortex®-M0, 16KB Flash, 2KB SRAM, 512B EEPROM, ADC, AES
PDF  114 Pages
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Hersteller  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
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STM32L021x4
Electrical characteristics
93
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
6.3.11
Electrical sensitivity characteristics
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the ANSI/JEDEC standard.
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
A supply overvoltage is applied to each power supply pin
A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Table 45. EMI characteristics
Symbol Parameter
Conditions
Monitored
frequency band
Max vs. frequency range
(32 MHz voltage Range 1)
Unit
SEMI
Peak level
VDD = 3.3 V,
TA = 25 °C,
LQFP32 package
compliant with IEC
61967-2
0.1 to 30 MHz
-22
dBµV
30 to 130 MHz
-7
130 MHz to 1GHz
-12
SAE EMI Level
1
-
Table 46. ESD absolute maximum ratings
Symbol
Ratings
Conditions
Class
Maximum
value(1)
1. Guaranteed by characterization results, not tested in production.
Unit
VESD(HBM)
Electrostatic discharge
voltage (human body model)
TA = +25 °C,
conforming to
ANSI/JEDEC JS-001
22000
V
VESD(CDM)
Electrostatic discharge
voltage (charge device
model)
TA = +25 °C,
conforming to
ANSI/ESD STM5.3.1.
C4
500



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