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ADS5500IPAPR Datenblatt(PDF) 3 Page - Texas Instruments

Teilenummer ADS5500IPAPR
Bauteilbeschribung  14-Bit, 125Msps ANALOG-TO-DIGITAL CONVERTER
PDF  37 Pages
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Hersteller  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
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ADS5500IPAPR Datenblatt(HTML) 3 Page - Texas Instruments

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ELECTRICAL CHARACTERISTICS
ADS5500
SBAS303F – DECEMBER 2003 – REVISED FEBRUARY 2007
RECOMMENDED OPERATING CONDITIONS (continued)
MIN
NOM
MAX
UNIT
Clock duty cycle (see Figure 49 for more information)
50%
0
70
Open free-air temperature range
°C
–40
85
Typ values given at T
A = 25°C, min and max specified over the full recommended operating temperature range, AVDD =
DRV
DD = 3.3 V, sampling rate = 125 Msps, 50% clock duty cycle, DLL On, 3-VPP differential clock, and –1-dBFS differential
input, unless otherwise noted
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Resolution
14
Bits
ANALOG INPUTS
Differential input range
2.3
VPP
Differential input impedance
See Figure 41
6.6
Differential input capacitance
See Figure 41
4
pF
Analog input common-mode current (per
300
µA
input)
Analog input bandwidth
Source impedance = 50
750
MHz
Clock
Voltage overload recovery time
4
Cycles
INTERNAL REFERENCE VOLTAGES
VREFM
Reference bottom voltage
0.97
V
VREFP
Reference top voltage
2.11
V
Reference error
– 4%
±0.9%
4%
VCM
Common-mode voltage output
1.55
±0.05
V
DYNAMIC DC CHARACTERISTICS AND ACCURACY
No missing codes
Tested
DNL
Differential linearity error
fIN = 10 MHz
–0.9
±0.75
1.1
LSB
INL
Integral linearity error
fIN = 10 MHz
–5
±2.5
5
LSB
Offset error
–11
±1.5
11
mV
Offset temperature coefficient 0.02
mV/
°C
∆offset error/∆AV
DD from AVDD = 3
DC power supply rejection ratio, DC PSRR
0.25
mV/V
V to AVDD = 3.6 V
Gain error (1)
–2
±0.45
2
%FS
Gain temperature coefficient
0.01
∆%/°C
DYNAMIC AC CHARACTERISTICS
25
°C to T
MAX
71.5
73.2
fIN = 10 MHz
Full temp range
70.5
72.8
fIN = 30 MHz
72.7
fIN = 55 MHz
71.9
SNR
Signal-to-noise ratio
25
°C to T
MAX
70.8
72.3
dBFS
fIN = 70 MHz
Full temp range
69.8
72
fIN = 100 MHz
71.2
fIN = 150 MHz
70.1
fIN = 225 MHz
69.1
RMS output noise
Input tied to common-mode
1.1
LSB
(1)
Gain error is specified by design and characterization; it is not tested in production.
3
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