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ADS5500IPAPR Datenblatt(PDF) 6 Page - Texas Instruments |
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ADS5500IPAPR Datenblatt(HTML) 6 Page - Texas Instruments |
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6 / 37 page ![]() www.ti.com TIMING CHARACTERISTICS TIMING CHARACTERISTICS (1) (2) ADS5500 SBAS303F – DECEMBER 2003 – REVISED FEBRUARY 2007 NOTE: It is recommended that the loading at CLKOUT and all data lines are accurately matched to ensure that the above timing matches closely with the specified values. Figure 1. Timing Diagram Typ values given at T A = 25°C, min and max specified over the full recommended operating temperature range, sampling rate = 125 Msps, 50% clock duty cycle, AV DD = DRVDD = 3.3 V, 3-VPP differential clock, and CLOAD = 10 pF, (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT SWITCHING SPECIFICATION tA Aperture delay Input CLK falling edge to data sampling point 1 ns Aperture jitter (uncertainty) Uncertainty in sampling instant 300 fs tsu Data setup time Data valid(3) to 50% of CLKOUT rising edge 2.1 2.5 ns th Data hold time 50% of CLKOUT rising edge to data becoming invalid(3) 1.7 2.1 ns tSTART Input clock to output data valid Input clock rising edge to Data valid start delay 2.2 2.9 ns start(4)(5) tEND Input clock to output data valid Input clock rising edge to Data valid end delay 5.8 6.9 ns end(4)(5) tJIT Output clock jitter Uncertainty in CLKOUT rising edge, peak-to-peak 150 210 ps tr Output clock rise time Rise time of CLKOUT measured from 20% to 80% of 1.7 1.9 ns DRVDD tf Output clock fall time Fall time of CLKOUT measured from 80% to 20% of 1.5 1.7 ns DRVDD tPDI Input clock to output clock delay Input clock rising edge, zero crossing, to output clock 4.2 4.8 5.5 ns rising edge 50% tr Data rise time Data rise time measured from 20% to 80% of DRVDD 3.6 4.6 ns tf Data fall time Data fall time measured from 80% to 20% of DRVDD 2.8 3.7 ns Output enable (OE) to data output Time required for outputs to have stable timings w.r.t 1000 Clock delay input clock( after OE is activated Cycles (1) Timing parameters are ensured by design and characterization and not tested in production. (2) See Table 5 through Table 8 in the Application Information section for timing information at additional sampling frequencies. (3) Data valid refers to 2 V for LOGIC high and 0.8 V for LOGIC low. (4) See the Output Information section for details on using the input clock for data capture. (5) These specifications apply when the CLKOUT polarity is set to rising edge (according to Table 3). Add ½ clock period for the valid number for a falling edge CLKOUT polarity. 6 Submit Documentation Feedback |
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