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ADS5500IPAPR Datenblatt(PDF) 6 Page - Texas Instruments

Teilenummer ADS5500IPAPR
Bauteilbeschribung  14-Bit, 125Msps ANALOG-TO-DIGITAL CONVERTER
PDF  37 Pages
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Hersteller  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
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ADS5500IPAPR Datenblatt(HTML) 6 Page - Texas Instruments

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TIMING CHARACTERISTICS
TIMING CHARACTERISTICS
(1) (2)
ADS5500
SBAS303F – DECEMBER 2003 – REVISED FEBRUARY 2007
NOTE: It is recommended that the loading at CLKOUT and all data lines are accurately matched to ensure that the above
timing matches closely with the specified values.
Figure 1. Timing Diagram
Typ values given at T
A = 25°C, min and max specified over the full recommended operating temperature range, sampling
rate = 125 Msps, 50% clock duty cycle, AV
DD = DRVDD = 3.3 V, 3-VPP differential clock, and CLOAD = 10 pF, (unless otherwise
noted)
PARAMETER
TEST CONDITIONS
MIN
TYP MAX
UNIT
SWITCHING SPECIFICATION
tA
Aperture delay
Input CLK falling edge to data sampling point
1
ns
Aperture jitter (uncertainty)
Uncertainty in sampling instant
300
fs
tsu
Data setup time
Data valid(3) to 50% of CLKOUT rising edge
2.1
2.5
ns
th
Data hold time
50% of CLKOUT rising edge to data becoming invalid(3)
1.7
2.1
ns
tSTART
Input clock to output data valid
Input clock rising edge to Data valid start delay
2.2
2.9
ns
start(4)(5)
tEND
Input clock to output data valid
Input clock rising edge to Data valid end delay
5.8
6.9
ns
end(4)(5)
tJIT
Output clock jitter
Uncertainty in CLKOUT rising edge, peak-to-peak
150
210
ps
tr
Output clock rise time
Rise time of CLKOUT measured from 20% to 80% of
1.7
1.9
ns
DRVDD
tf
Output clock fall time
Fall time of CLKOUT measured from 80% to 20% of
1.5
1.7
ns
DRVDD
tPDI
Input clock to output clock delay
Input clock rising edge, zero crossing, to output clock
4.2
4.8
5.5
ns
rising edge 50%
tr
Data rise time
Data rise time measured from 20% to 80% of DRVDD
3.6
4.6
ns
tf
Data fall time
Data fall time measured from 80% to 20% of DRVDD
2.8
3.7
ns
Output enable (OE) to data output
Time required for outputs to have stable timings w.r.t
1000
Clock
delay
input clock( after OE is activated
Cycles
(1)
Timing parameters are ensured by design and characterization and not tested in production.
(2)
See Table 5 through Table 8 in the Application Information section for timing information at additional sampling frequencies.
(3)
Data valid refers to 2 V for LOGIC high and 0.8 V for LOGIC low.
(4)
See the Output Information section for details on using the input clock for data capture.
(5)
These specifications apply when the CLKOUT polarity is set to rising edge (according to Table 3). Add ½ clock period for the valid
number for a falling edge CLKOUT polarity.
6
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