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AT25QL641 Datenblatt(PDF) 66 Page - Dialog Semiconductor

Teilenummer AT25QL641
Bauteilbeschribung  64-Mbit, 1.7V Minimum SPI Serial Flash Memory with Dual I/O, Quad I/O and QPI Support
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AT25QL641
DS-25QL641–130E–10/2018
8.
ElectricalCharacteristics
Table 8-1.
Absolute Maximum Ratings (1)
1.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. The “Absolute
Maximum Ratings” are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated
in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods
may affect device reliability. Voltage extremes referenced in the “Absolute Maximum Ratings” are intended to accommodate short
duration undershoot/overshoot conditions and does not imply or guarantee functional device operation at these levels for any extended
period of time.
Parameter
Symbol
Conditions
Value
Units
Supply Voltage
VCC
-0.6 to VCC+0.4
V
Voltage Applied to any pin
VIO
Relative to Ground
-0.6 to VCC +0.4
V
Transient Voltage on any pin
VIOT
<20nS Transient Relative
to Ground
-1.0V to VCC +1.0V
V
Storage temperature
TSTG
-65
to +150
˚C
Lead temperature
TLEAD
See Note
(2)
2.
Compliant with JEDEC Standard J-STD-20C for small body Sn-Pb or Pb-free (Green) assembly and the European directive on
restrictions on hazardous substances (RoHS) 2002/95/EU.
˚C
Electrostatic discharge
voltage
VESD
Human Body Model
(3)
3.
JEDEC Std JESD22-A114A (C1 = 100 pF, R1 = 1500Ω, R2 = 500Ω).
-2000 to +2000
V
Table 8-2.
Operating Ranges
Parameter
Symbols
Conditions
Min
Max
Units
Supply Voltage
VCC
f
R = 133 MHz (Single/Dual/Quad SPI)
f
R = 50 MHz (Read Data 03h)
1.7
2.0
V
Ambient Operating
Temperature
T
A
Industrial
-40
+85
oC
Table 8-3.
Endurance and Data Retention
Parameter
Conditions
Min
Max
Units
Erase/Program Cycles
4 KB Block, 32/64 KB block, or full chip
100,000
Cycles
Data Retention
Full Temperature Range
20
Years



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