| Datenblatt-Suchmaschine für elektronische Bauteile |
|
ADP1876ACPZ-R7 Datenblatt(PDF) 7 Page - Analog Devices |
|
|
|||||||||||||||||||||||||||||
ADP1876ACPZ-R7 Datenblatt(HTML) 7 Page - Analog Devices |
|
7 / 24 page ![]() Data Sheet ADP1876 Rev. A | Page 7 of 24 ABSOLUTE MAXIMUM RATINGS Table 2. Parameter Rating VIN, EN1/EN2, RAMP1/RAMP2 21 V FB1/FB2, COMP1/COMP2, SS1/SS2, TRK1, VINLDO, VOUTLDO, VCCO, VDL, PGOOD1/PGOOD2 −0.3 V to +6 V ILIM1/ILIM2 −0.3 V to +21 V BST1/BST2 to SW1/SW2 −0.3 V to +6 V BST1/BST2, DH1/DH2, SW1/SW2 to PGND1/PGND2 −0.3 V to +28 V DL1/DL2 to PGND1/PGND2 −0.3 V to VCCO + 0.3 V BST1/BST2 to PGND1/PGND2, SW1/SW2 to PGND1/PGND2 (20 ns Transients) 32 V SW1, SW2 to PGND1, PGND2 (20 ns Transients) 25 V DL1/DL2, SW1/SW2, ILIM1/ILIM2 to PGND1/PGND2 (20 ns Negative Transients) −8 V PGND1/PGND2 to AGND −0.3 V to +0.3 V PGND1/PGND2 to AGND (20 ns Transients) −8 V to +4 V θJA, Multilayer PCB (Natural Convection)1,2 32.6°C/W Operating Junction Temperature Range3 −40°C to +125°C Storage Temperature Range −65°C to +150°C Maximum Soldering Lead Temperature 260°C 1 Measured with exposed pad attached to the printed circuit board (PCB). 2 Junction-to-ambient thermal resistance (θ JA) of the package was calculated or simulated on a multilayer PCB. 3 The junction temperature, T J, of the device is dependent on the ambient temperature, TA, the power dissipation of the device, PD, and the junction to ambient thermal resistance of the package, θJA. Maximum junction temperature is calculated from the ambient temperature and power dissipation using the formula, TJ = TA + PD × θJA. Absolute maximum ratings apply individually only, not in combination. Unless otherwise specified, all other voltages are referenced to GND. ESD CAUTION Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. |
|
|
Link URL |
| War ALLDATASHEET hilfreich? [ DONATE ] |
Über Alldatasheet | Werbung | Kontakt | Privatsphäre und Datenschutz | Link zum Datenblatt | Linktausch | Hersteller All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |