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STM32U595AI Datenblatt(PDF) 340 Page - STMicroelectronics |
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STM32U595AI Datenblatt(HTML) 340 Page - STMicroelectronics |
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340 / 377 page ![]() Electrical characteristics STM32U59xxx 340/377 DS13633 Rev 1 The parameters given in tables below are derived from tests performed under temperature and VDD supply voltage conditions summarized in Table 32: General operating conditions. Table 147. OTG_HS electrical characteristics(1) Symbol Parameter Condition Min Typ Max Unit VDDUSB USB transceiver operating voltage - 3.12(2) -3.6 V fHCLK fHCLK value to guarantee proper operation of the OTG_HS interface -30(3) -- MHz RPUI Embedded OTG_HS_DP pull-up value during idle - 900 1250 1575 Ω RPUR Embedded OTG_HS_DP pull-up value during reception - 1425(3) 2250 3090(3) RPD Embedded OTG_HS_DP and OTG_HS_DM pull-down value - 14250 - 24800 ZDRV Output driver impedance(4) Driving high or low 40.5(3) 45 49.5(3) tlr Rise time CL < 5 pF 0.5(3) -- ns tlf Fall time CL < 5 pF 0.5(3) -- tlrfm Rise/fall time matching - 80(3) - 125(3) % 1. Evaluated by characterization. Not tested in production, unless otherwise specified. 2. The USB functionality is ensured down to 3 V but not the full USB electrical characteristics which are degraded in 3.0 to 3.12 V voltage range. 3. Specified by design. Not tested in production. 4. No external termination series resistors are required on OTG_HS_DP (D+) and OTG_HS_DM (D-). The matching impedance is already included in the embedded driver. Table 148. OTG_HS DC electrical characteristics(1) Symbol Parameter Condition Min Typ Max Unit Vhssq High-speed squelch detection threshold - 100(2) - 150 mV Vhsdsc High-speed disconnect detection threshold - 525 - 625 Vhsdif High-speed differential detection threshold - 100 - - Vhscm High-speed data signaling common mode voltage range - -50 - 500 Vhsoi High-speed idle level - -10 - 10 Vhsoh High-speed data signaling high - 360 - 440 Vhsol High-speed data signaling low - -10 - 10 Vhchirpj Chirp J level - 700 - 1100 Vhchirpk Chirp K level - -900 - -500 1. Evaluated by characterization. Not tested in production. 2. 50 mV test waivers from usb.org have been applied. |
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