MPC5644BCAMMJ1 datasheet(78/116 Pages) NXP

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MPC5646C Microcontroller DataSheet, Rev. 7

Electrical Characteristics

NXP Semiconductors

| DNL |

T Absolute differential

non-linearity

No overload

—

0.5

1.0

LSB

| OFS |

T Absolute offset error

—

0.5

—

LSB

| GNE |

T Absolute gain error

——

0.6

—

LSB

TUEP

P Total unadjusted

error8 for precise

channels, input only

pins

Without current injection

−2

0.6

LSB

With current injection

−3

TUEX

T Total unadjusted

error(8) for extended

channel

Without current injection

−3

LSB

With current injection

−4

1 V

DD = 3.3 V ± 10% / 5.0 V ± 10%, TA = −40 to 125 °C, unless otherwise specified.

2 Analog and digital V

SS_HV must be common (to be tied together externally).

3 V

AINx may exceed VSS_ADC0 and VDD_ADC0 limits, remaining on absolute maximum ratings, but the results of the

conversion will be clamped respectively to 0x000 or 0x3FF.

4 During the sample time the input capacitance C

S can be charged/discharged by the external source. The internal

resistance of the analog source must allow the capacitance to reach its final voltage level within tADC0_S. After the

end of the sample time tADC0_S, changes of the analog input voltage have no effect on the conversion result. Values

for the sample clock tADC0_S depend on programming.

5 This parameter does not include the sample time t

ADC0_S, but only the time for determining the digital result and

the time to load the result's register with the conversion result

6 Refer to ADC conversion table for detailed calculations.

7 PB10 should not have any current injected. It can disturb accuracy on other ADC_0 pins.

8 Total Unadjusted Error: The maximum error that occurs without adjusting Offset and Gain errors. This error is a

combination of Offset, Gain and Integral Linearity errors.

Table 42. ADC conversion characteristics (10-bit ADC_0) (continued)

Symbol

Parameter

Conditions1

Value

Unit

Min

Typ

Max

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