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TMS570LS3137 Datenblatt(PDF) 37 Page - Texas Instruments

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Teilenummer TMS570LS3137
Bauteilbeschribung  TMS570LS3137 16/32-Bit RISC Flash Microcontroller
PDF  159 Pages
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Hersteller  TI [Texas Instruments]
Direct Link  http://www.ti.com
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TMS570LS3137 Datenblatt(HTML) 37 Page - Texas Instruments

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TMS570LS3137
www.ti.com
SPNS162.
– SEPTEMBER 2011
2.4.2.18 Test and Debug Modules Interface
Table 2-40. ZWT Test and Debug Modules Interface
Terminal
Signal
Default
Pull Type
Description
Type
Pull State
Signal Name
337
ZWT
TEST
U2
I/O
Pull Down
Fixed, 100uA
Test enable
nTRST
D18
Input
JTAG test hardware reset
RTCK
A16
Output
-
-
JTAG return test clock
TCK
B18
Input
Pull Down
Fixed, 100uA
JTAG test clock
TDI
A17
I/O
Pull Up
JTAG test data in
TDO
C18
I/O
Pull Down
JTAG test data out
TMS
C19
I/O
Pull Up
JTAG test select
2.4.2.19 Flash Supply and Test Pads
Table 2-41. ZWT Flash Supply and Test Pads
Terminal
Signal
Default
Pull Type
Description
Type
Pull State
Signal Name
337
ZWT
VCCP
F8
Input
-
-
Flash pump supply
FLTP1
J5
Flash test pads. These
terminals are reserved for
FLTP2
H5
TI use only. For proper
operation these terminals
must connect only to a
test pad or not be
connected at all [no
connect (NC)].
Copyright
© 2011, Texas Instruments Incorporated
Device Package and Terminal Functions
37
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focus.ti.com: TMS570LS3137



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