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TMS570LS3137 Datenblatt(PDF) 20 Page - Texas Instruments

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Teilenummer TMS570LS3137
Bauteilbeschribung  TMS570LS3137 16/32-Bit RISC Flash Microcontroller
PDF  159 Pages
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Hersteller  TI [Texas Instruments]
Direct Link  http://www.ti.com
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TMS570LS3137 Datenblatt(HTML) 20 Page - Texas Instruments

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TMS570LS3137
SPNS162.
– SEPTEMBER 2011
www.ti.com
2.4.1.13 Clock Inputs and Outputs
Table 2-17. PGE Clock Inputs and Outputs
Terminal
Signal
Default
Pull Type
Description
Type
Pull State
Signal Name
144
PGE
OSCIN
18
Input
-
-
From external
crystal/resonator, or
external clock input
KELVIN_GND
19
Input
Kelvin ground for oscillator
OSCOUT
20
Output
To external
crystal/resonator
ECLK
119
I/O
Pull Down
Programmable,
External prescaled clock
20uA
output, or GIO.
GIOA[5]/EXTCLKIN
14
Input
Pull Down
20uA
External clock input #1
2.4.1.14 Test and Debug Modules Interface
Table 2-18. PGE Test and Debug Modules Interface
Terminal
Signal
Default
Pull Type
Description
Type
Pull State
Signal Name
144
PGE
TEST
34
I/O
Pull Down
Fixed, 100uA
Test enable
nTRST
109
Input
JTAG test hardware reset
RTCK
113
Output
-
-
JTAG return test clock
TCK
112
Input
Pull Down
Fixed, 100uA
JTAG test clock
TDI
110
I/O
Pull Up
JTAG test data in
TDO
111
I/O
Pull Down
JTAG test data out
TMS
108
I/O
Pull Up
JTAG test select
2.4.1.15 Flash Supply and Test Pads
Table 2-19. PGE Flash Supply and Test Pads
Terminal
Signal
Default
Pull Type
Description
Type
Pull State
Signal Name
144
PGE
VCCP
134
Input
-
-
Flash pump supply
FLTP1
7
Flash test pads. These
terminals are reserved for
FLTP2
8
TI use only. For proper
operation these terminals
must connect only to a
test pad or not be
connected at all [no
connect (NC)].
20
Device Package and Terminal Functions
Copyright
© 2011, Texas Instruments Incorporated
Submit Documentation Feedback
focus.ti.com: TMS570LS3137



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