 |
Datenblatt-Suchmaschine für elektronische Bauteile |
|
|
Datenblatt-Suchmaschine für elektronische Bauteile |
|
TMS570LS3137 Datenblatt(PDF) 82 Page - Texas Instruments |
|
|
|
|||||||||||||||||||||||||||||
TMS570LS3137 Datenblatt(HTML) 82 Page - Texas Instruments |
|
|
82 / 159 page  TMS570LS3137 SPNS162. – SEPTEMBER 2011 www.ti.com 4.13 On-Chip SRAM Initialization and Testing 4.13.1 On-Chip SRAM Self-Test Using PBIST 4.13.1.1 Features • Extensive instruction set to support various memory test algorithms • ROM-based algorithms allow application to run TI production-level memory tests • Independent testing of all on-chip SRAM 4.13.1.2 PBIST RAM Groups Table 4-25. PBIST RAM Grouping Test Pattern (Algorithm) March 13N(1) March 13N(1) triple read triple read two port single port Memory RAM Group Test Clock MEM Type slow read fast read (cycles) (cycles) ALGO MASK ALGO MASK ALGO MASK ALGO MASK 0x1 0x2 0x4 0x8 PBIST_ROM 1 ROM CLK ROM X X STC_ROM 2 ROM CLK ROM X X DCAN1 3 VCLK Dual Port 25200 DCAN2 4 VCLK Dual Port 25200 DCAN3 5 VCLK Dual Port 25200 ESRAM1 6 HCLK Single Port 266280 MIBSPI1 7 VCLK Dual Port 33440 MIBSPI3 8 VCLK Dual Port 33440 MIBSPI5 9 VCLK Dual Port 33440 VIM 10 VCLK Dual Port 12560 MIBADC1 11 VCLK Dual Port 4200 DMA 12 HCLK Dual Port 18960 N2HET1 13 VCLK Dual Port 31680 HET TU1 14 VCLK Dual Port 6480 RTP 15 HCLK Dual Port 37800 16 VCLK Dual Port 75400 FLEXRAY 17 Single Port 133160 MIBADC2 18 VCLK Dual Port 4200 N2HET2 19 VCLK Dual Port 31680 HET TU2 20 VCLK Dual Port 6480 ESRAM5 21 HCLK Single Port 266280 ESRAM6 22 HCLK Single Port 266280 23 8700 Dual Port ETHERNET 24 VCLK3 6360 25 Single Port 133160 ESRAM8 28 HCLK Single Port 266280 (1) There are several memory testing algorithms stored in the PBIST ROM. However, TI recommends the March13N algorithm for application testing. The PBIST ROM clock frequency is limited to 90MHz, if 90MHz < HCLK <= HCLKmax, or HCLK, if HCLK <= 90MHz. The PBIST ROM clock is divided down from HCLK. The divider is selected by programming the ROM_DIV field of the Memory Self-Test Global Control Register (MSTGCR) at address 0xFFFFFF58. 82 System Information and Electrical Specifications Copyright © 2011, Texas Instruments Incorporated Submit Documentation Feedback focus.ti.com: TMS570LS3137 |
|
Link URL |
| War ALLDATASHEET hilfreich? [ DONATE ] |
Über Alldatasheet | Werbung | Kontakt | Privatsphäre und Datenschutz | Link zum Datenblatt | Linktausch | Hersteller All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
German ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
