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AM79C940VCW Datenblatt(PDF) 93 Page - Advanced Micro Devices |
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AM79C940VCW Datenblatt(HTML) 93 Page - Advanced Micro Devices |
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93 / 122 page ![]() AMD 93 Am79C940 AC CHARACTERISTICS (continued) Parameter No. Symbol Parameter Description Test Conditions Min (ns) Max (ns) AUI Timing 53 tDOTD XTAL1 (externally driven) to DO ± output 100 54 tDOTR DO ± rise time (10% to 90%) 2.5 5.0 55 tDOTF DO ± fall time (10% to 90%) 2.5 5.0 56 tDOETM DO ± rise and fall mismatch 1 57 tDOETD DO ± End of Transmit Delimiter 200 375 58 tPWRDI DI ± pulse width to reject |input| > |VASQ|15 59 tPWODI DI ± pulse width to turn on |input| > |VASQ|45 internal DI carrier sense 60 tPWMDI DI ± pulse width to maintain |input| > |VASQ| 45 136 internal DI carrier sense on 61 tPWKDI DI ± pulse width to turn internal |input| > |VASQ| 200 DI carier sense off 62 tPWRCI CI ± pulse width to reject |input| > |VASQ|10 63 tPWOCI CI ± pulse width to turn on |input| > |VASQ|26 internal SQE sense 64 tPWMCI CI ± pulse width to maintain |input| > |VASQ|26 90 internal SQE sense on 65 tPWKCI CI ± pulse width to turn internal |input| > |VASQ| 160 SQE sense off 66 tSQED CI ± SQE Test delay from |input| > |VASQ| O ± inactive 67 tSQEL CI ± SQE Test length |input| > |VASQ| 79 tCLSHI CLSN high time tSTDC+30 80 tTXH TXEN or DO ± hold time from |input| > |VASQ| 32*tSTDC 96*tSTDC CLSN ↑ DAI Port Timing 70 tTXEND STDCLK ↑ delay to TXEN↓ CL = 50 pF 70 72 tTXDD STDCLK ↑ delay to TXDAT± CL = 50 pF 70 change 80 tXH TXEN or TXDAT ± hold time 32*tSTDC 96*tSTDC from CLSN ↑ 95 tDOTF Mismatch in STDCLK ≠ to TXEN↓ 15 and TXDAT ± change 96 tTXDTR TXDAT ± rise time See Note 1 5 97 tTXDTF TXDAT ± fall time See Note 1 5 98 tTXDTM TXDAT ± rise and fall mismatch See Note 1 1 99 tTXENETD TXEN End of Transmit Delimiter 250 350 100 tFRXDD First RXDAT ↓ delay to RXCRS↑ 100 101 tLRXDD Last RXDAT ≠ delay to RXCRS↓ 120 102 tCRSCLSD RXCRS ↑ delay to CLSN↑ 100 ( TXEN = 0) |
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