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Datenblatt-Suchmaschine für elektronische Bauteile |
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Datenblatt-Suchmaschine für elektronische Bauteile |
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RZ/T1 Datenblatt(PDF) 126 Page - Renesas Technology Corp |
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RZ/T1 Datenblatt(HTML) 126 Page - Renesas Technology Corp |
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126 / 139 page  R01DS0228EJ0200 Rev.2.00 Page 126 of 139 Jun. 30, 2025 RZ/T1 Group 2. Electrical Characteristics 2.6 A/D Conversion Characteristics Conditions: VDD = PLLVDD0 = PLLVDD1 = DVDD_USB = 1.14 to 1.26 V, VCCQ33 = AVCC0 = AVCC1 = VREFH0 = VREFH1 = VDD33_USB = 3.0 to 3.6 V VSS = PLLVSS0 = PLLVSS1 = AVSS0 = AVSS1 = VREFL0 = VREFL1 = VSS_USB = 0 V, Tj = -40 to 125°C Note: The 176-pin HLFQFP does not have pins AVCC1, AVSS1, VREFH1, and VREFL1. Table 2.37 12-Bit A/D (Unit 0) Conversion Characteristics Item min typ max Unit Test Conditions Resolution 8 ― 12 Bit Analog input capacitance ― ― 30 pF Channel-dedicated sample-and-hold circuits in use (AN000 to AN003) When disconnection detection assistance is in use Conversion time*1 (Operation at PCLKF = 60 MHz) Permissible signal source impedance Max. = 1.0 kΩ 1.2 (0.4 + 0.4) *2 ―3.6 μs Sampling of channel- dedicated sample-and- hold circuits in 24 states Sampling in 24 states Offset error ― ― ±7.5 LSB Full-scale error ― ― ±7.5 LSB Quantization error ― ±0.5 ― LSB Absolute accuracy ― ― ±7.5 LSB DNL differential nonlinearity error ― ― ±3.0 LSB INL integral nonlinearity error ― ― ±4.0 LSB Holding characteristics of sample-and-hold circuits ― ― 3.2 μs Self-diagnosis + 4-channel simultaneous sampling Dynamic range 0.25 ― VREFH0 – 0.25 V Channel-dedicated sample-and-hold circuits in use (AN000 to AN003) When disconnection detection assistance is not in use Conversion time*1 (Operation at PCLKF = 60 MHz) Permissible signal source impedance Max. = 1.0 kΩ 1.2 (0.4 + 0.4) *2 ―3.6 μs Sampling of channel- dedicated sample-and- hold circuits in 24 states Sampling in 24 states Offset error ― ― ±6.5 LSB Full-scale error ― ― ±6.5 LSB Quantization error ― ±0.5 ― LSB Absolute accuracy ― ― ±6.5 LSB DNL differential nonlinearity error ― ― ±3.0 LSB INL integral nonlinearity error ― ― ±4.0 LSB Holding characteristics of sample-and-hold circuits ― ― 3.2 μs Self-diagnosis + 4-channel simultaneous sampling Dynamic range 0.25 ― VREFH0 – 0.25 V Channel-dedicated sample-and-hold circuits not in use (AN000 to AN007) Conversion time*1 (Operation at PCLKF = 60 MHz) Permissible signal source impedance Max. = 1.0 kΩ 0.483 (0.267)*2 ― ― μs Sampling in 16 states Offset error ― ― ±5.0 LSB Full-scale error ― ― ±5.0 LSB Quantization error ― ±0.5 ― LSB Absolute accuracy ― ― ±6.0 LSB DNL differential nonlinearity error ― ― ±2.5 LSB INL integral nonlinearity error ― ― ±3.0 LSB |
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