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28HS01GTAM03 Datenblatt(PDF) 108 Page - Infineon Technologies AG |
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28HS01GTAM03 Datenblatt(HTML) 108 Page - Infineon Technologies AG |
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108 / 138 page ![]() Datasheet 108 of 138 002-18216 Rev. *W 2022-01-18 256Mb/512Mb/1Gb SEMPER™ Flash Octal interface, 1.8V/3.0V Electrical characteristics 7.7 AC test conditions Figure 70 Test setup Table 84 AC measurement conditions[42] Parameter Min Max Unit Reference Figure Load Capacitance (CL) 15 pF Figure 70 Input Pulse Voltage 0 VCCQ V Figure 72 CK Rise (tCRT1) and Fall (tCFT1) Slew Rates at 200MHz (HS-T)[41] 1.13 V/ns Figure 75 CK Rise (tCRT2) and Fall (tCFT2) Slew Rates at 166MHz (HL-T)[41] 1.72 Data Rise (tDRT1) and Fall (tDFT1) Slew Rates at 200MHz (HS-T)[41] 1.13 Figure 72 Data Rise (tDRT2) and Fall (tDFT2) Slew Rates at 166MHz (HL-T)[41] 1.72 VIL(ac) 0.30 VCCQ 0.30 VCCQ V VIH(ac) 0.7 VCCQ 1.30 VCCQ VOH(ac) 0.75 VCCQ Figure 73 / Figure 74 VOL(ac) 0.25 VCCQ Input Timing Ref Voltage 0.5 VCC Output Timing Ref Voltage 0.5 VCC Notes 41. Input slew rate measured from input pulse min to max at VCC max. 42. AC characteristics tables assume clock and data signals have the same slew rate (slope). Device Under Test CL |
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