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Datenblatt-Suchmaschine für elektronische Bauteile |
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Datenblatt-Suchmaschine für elektronische Bauteile |
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FS26 Datenblatt(PDF) 124 Page - NXP Semiconductors |
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FS26 Datenblatt(HTML) 124 Page - NXP Semiconductors |
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124 / 156 page  NXP Semiconductors FS26 Safety system basis chip with low power for ASIL D/ASIL B SPI flag Interrupt mask Interrupt flag Corresponding event description LDT_M LDT_I LDT event occurred (Function 1 only) GPIO2_M GPIO2_I GPIO2 event occurred GPIO1_M GPIO1_I GPIO1 event occurred WK2_M WK2_I WAKE2 event occurred WK1_M WK1_I WAKE1 event occurred WIO_G — WUEVENT[3:0] Wake-up event occurred MSPI_CRC_M MSPI_CRC_I Main SPI CRC calculation is incorrect MSPI_CLK_M MSPI_CLK_I Main SPI clock provided wrong number of clock pulses COM_G MSPI_REQ_M MSPI_REQ_I MCU writes to an invalid register in the Main domain — — — Main state machine entered in normal mode Table 121. List of Interrupt sources from Main logic...continued SPI flag Interrupt global flag Interrupt mask Interrupt flag Corresponding event description VPRE_OV An overvoltage event occurred on VMON_PRE monitoring VPRE_M VPRE_UV An undervoltage event occurred on VMON_PRE monitoring CORE_OV An overvoltage event occurred on VMON_CORE monitoring CORE_M CORE_UV An undervoltage event occurred on VMON_CORE monitoring LDO1_OV An overvoltage event occurred on VMON_LDO1 monitoring LDO1_M LDO1_UV An undervoltage event occurred on VMON_LDO1 monitoring LDO2_OV An overvoltage event occurred on VMON_LDO2 monitoring LDO2_M LDO2_UV An undervoltage event occurred on VMON_LDO2 monitoring TRK1_OV An overvoltage event occurred on VMON_TRK1 monitoring TRK1_M TRK1_UV An undervoltage event occurred on VMON_TRK1 monitoring TRK2_OV An overvoltage event occurred on VMON_TRK2 monitoring TRK2_M TRK2_UV An undervoltage event occurred on VMON_TRK2 monitoring REF_OV An overvoltage event occurred on VMON_REF monitoring REF_M REF_UV An undervoltage event occurred on VMON_REF monitoring EXT_OV An overvoltage event occurred on VMON_EXT monitoring FS_REG_ OVUV_G EXT_M EXT_UV An undervoltage event occurred on VMON_EXT monitoring FCCU1_M / FCCU2_M FCCU12 An event occurred on FCCU1 monitoring FCCU1_M FCCU1 bit An event occurred on FCCU1 monitoring FCCU2_M FCCU2 bit An event occurred on FCCU2 monitoring FS_G — ERRMON_M ERRMON bit An event occurred on external IC monitoring BAD_WD_DATA A bad watchdog data refresh occurred FS_G / COM_G FS_WD_G BAD_WD_M BAD_WD_TIMING A bad watchdog timing refresh occurred — — — — Fail-safe state machine entered in initialization phase Table 122. List of Interrupt sources from the fail-safe domain FS26_SDS All information provided in this document is subject to legal disclaimers. © 2025 NXP B.V. All rights reserved. Product short data sheet Rev. 6.0 — 12 December 2025 Document feedback 124 / 156 |
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